Dispersion Analysis of Perpendicular Modes Using a Hybrid Two-Trace Two-Dimensional (2T2D) Smart Error Sum.

IF 2.2 3区 化学 Q2 INSTRUMENTS & INSTRUMENTATION Applied Spectroscopy Pub Date : 2024-05-09 DOI:10.1177/00037028241252442
Thomas G Mayerhöfer, Isao Noda, Jürgen Popp
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Abstract

Using linear dichroism theory, one would assume that a z-cut of a uniaxial crystal is equivalent to an x-cut to determine the perpendicular component of the dielectric tensor and the corresponding oscillator parameters. However, Fresnel's equations show that the effect of interfaces in the form of the continuity relations of the different components of the electric field must be considered. A consequence of the continuity relations is that perpendicular modes increase less significantly in strength with increasing angle of incidence than expected. This is a consequence of the fact that it is the inverse of the perpendicular component of the dielectric function that increasingly becomes important with a growing angle of incidence. An inverse dielectric function, however, has typically much smaller values than the dielectric function. An additional consequence is that perpendicular modes are blueshifted and coupled in such a way that oscillator strength is transferred to the higher wavenumber mode. Thus, the spectral signatures of perpendicular modes are often weak and masked by the parallel modes when two modes overlap. Accordingly, to enable dispersion analysis, it is suggested to use a hybrid of the conventional residual sum of squares and the two-trace two-dimensional (2T2D) smart error sum, which can correct systematic multiplicable errors in the experimental spectrum. As demonstrated for fresnoite (Ba2TiSi2O8), this is an important step toward determining the perpendicular component of the dielectric tensor and the corresponding oscillator parameters using dispersion analysis, since asynchronous 2T2D correlation spectra are, in particular, sensitive to perpendicular modes.

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利用混合双踪二维 (2T2D) 智能误差和对垂直模式进行频散分析。
利用线性二色性理论,我们可以认为单轴晶体的 z 切等同于 x 切,从而确定介电张量的垂直分量和相应的振荡器参数。然而,菲涅尔方程表明,必须考虑电场不同分量的连续性关系形式的界面影响。连续性关系的一个结果是,垂直模式的强度随入射角度增加而增加的幅度比预期的要小。这是因为随着入射角的增大,介电函数垂直分量的倒数变得越来越重要。然而,介电常数的逆分量通常比介电常数小得多。另一个结果是,垂直模式会发生蓝移和耦合,从而使振荡器强度转移到高波长模式上。因此,当两个模式重叠时,垂直模式的光谱特征往往很弱,并被平行模式掩盖。因此,为了进行频散分析,建议使用传统的残差平方和与双踪二维(2T2D)智能误差和的混合方法,它可以修正实验频谱中的系统可乘误差。正如针对辉绿岩(Ba2TiSi2O8)所演示的那样,这是利用色散分析确定介电张量垂直分量和相应振荡器参数的重要一步,因为异步 2T2D 相关光谱对垂直模式特别敏感。
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来源期刊
Applied Spectroscopy
Applied Spectroscopy 工程技术-光谱学
CiteScore
6.60
自引率
5.70%
发文量
139
审稿时长
3.5 months
期刊介绍: Applied Spectroscopy is one of the world''s leading spectroscopy journals, publishing high-quality peer-reviewed articles, both fundamental and applied, covering all aspects of spectroscopy. Established in 1951, the journal is owned by the Society for Applied Spectroscopy and is published monthly. The journal is dedicated to fulfilling the mission of the Society to “…advance and disseminate knowledge and information concerning the art and science of spectroscopy and other allied sciences.”
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