{"title":"Combined Shewhart–EWMA and Shewhart–CUSUM monitoring schemes for time between events","authors":"Xuelong Hu, Fan Xia, Jiujun Zhang, Zhi Song","doi":"10.1002/qre.3571","DOIUrl":null,"url":null,"abstract":"To improve the detecting abilities of upward and downward parameter changes in high‐quality process, two combined schemes by integrating memory‐type, that is, exponentially weighted moving average (EWMA) or cumulative sum (CUSUM), and memoryless, that is, Shewhart, are proposed for monitoring the time between events (TBE), which is modeled as an exponential distributed variable. A Monte Carlo simulation method is employed to obtain the Run Length () properties, that is average run length (), of the proposed schemes for different parameter settings. The nearly optimal monitoring parameter combinations under different change size are obtained by minimizing the out‐of‐control with the satisfied in‐control . Using the designed parameters, the performance of the proposed monitoring schemes is compared with the existing EWMA and CUSUM TBE. The results show that the proposed combined Shewhart–EWMA or Shewhart–CUSUM TBE generally perform better than the corresponding EWMA or CUSUM TBE for large changes and they also show better performance than the Shewhart TBE for small changes. Finally, a real dataset of organic light‐emitting diode (OLED) failure time from Sumsung company is employed to indicate the usage and implementation of combined TBE schemes.","PeriodicalId":56088,"journal":{"name":"Quality and Reliability Engineering International","volume":null,"pages":null},"PeriodicalIF":2.2000,"publicationDate":"2024-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Quality and Reliability Engineering International","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1002/qre.3571","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, INDUSTRIAL","Score":null,"Total":0}
引用次数: 0
Abstract
To improve the detecting abilities of upward and downward parameter changes in high‐quality process, two combined schemes by integrating memory‐type, that is, exponentially weighted moving average (EWMA) or cumulative sum (CUSUM), and memoryless, that is, Shewhart, are proposed for monitoring the time between events (TBE), which is modeled as an exponential distributed variable. A Monte Carlo simulation method is employed to obtain the Run Length () properties, that is average run length (), of the proposed schemes for different parameter settings. The nearly optimal monitoring parameter combinations under different change size are obtained by minimizing the out‐of‐control with the satisfied in‐control . Using the designed parameters, the performance of the proposed monitoring schemes is compared with the existing EWMA and CUSUM TBE. The results show that the proposed combined Shewhart–EWMA or Shewhart–CUSUM TBE generally perform better than the corresponding EWMA or CUSUM TBE for large changes and they also show better performance than the Shewhart TBE for small changes. Finally, a real dataset of organic light‐emitting diode (OLED) failure time from Sumsung company is employed to indicate the usage and implementation of combined TBE schemes.
期刊介绍:
Quality and Reliability Engineering International is a journal devoted to practical engineering aspects of quality and reliability. A refereed technical journal published eight times per year, it covers the development and practical application of existing theoretical methods, research and industrial practices. Articles in the journal will be concerned with case studies, tutorial-type reviews and also with applications of new or well-known theory to the solution of actual quality and reliability problems in engineering.
Papers describing the use of mathematical and statistical tools to solve real life industrial problems are encouraged, provided that the emphasis is placed on practical applications and demonstrated case studies.
The scope of the journal is intended to include components, physics of failure, equipment and systems from the fields of electronic, electrical, mechanical and systems engineering. The areas of communications, aerospace, automotive, railways, shipboard equipment, control engineering and consumer products are all covered by the journal.
Quality and reliability of hardware as well as software are covered. Papers on software engineering and its impact on product quality and reliability are encouraged. The journal will also cover the management of quality and reliability in the engineering industry.
Special issues on a variety of key topics are published every year and contribute to the enhancement of Quality and Reliability Engineering International as a major reference in its field.