Ana Cipriš , Ivana Puljić , Damir Aumiler, Ticijana Ban, Neven Šantić
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引用次数: 0
Abstract
We report on the absolute frequency determination of the 5s5p - 5s5d transition in atomic strontium, achieved through frequency comb-referenced laser-induced-fluorescence (LIF) spectroscopy. We excite the - 5s5p transition using an on-resonance laser at 461 nm, and then measure the variation in the LIF signal while scanning the laser at 767 nm across the 5s5p - 5s5d transition. We determine the absolute frequency of MHz, with an accuracy that surpasses the previous most accurate measurement by two orders of magnitude. This measurement technique can be readily applied for precision spectroscopy of high-lying states not only in strontium, but also in other atomic species.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.