Theoretico-experimental analysis of bistability in the oscillatory response of a TaOx ReRAM to pulse train stimuli

IF 4.1 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY Frontiers in Nanotechnology Pub Date : 2024-05-15 DOI:10.3389/fnano.2024.1301320
N. Schmitt, A. Ascoli, I. Messaris, A. S. Demirkol, S. Menzel, V. Rana, R. Tetzlaff, L. O. Chua
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Abstract

Fading memory is the capability of a physical system to approach a unique asymptotic behaviour, irrespective of the initial conditions, when stimulated by an input from a certain class. Standard stimuli from the AC periodic class typically induce fading memory effects in non-volatile memristors, as uncovered for the first time back in 2016. Very recently, a deep investigation of resistance switching phenomena in a TaOx resistive random access memory cell revealed the capability of the nano-device to exhibit one of two possible oscillatory behaviours, depending upon the initial condition, when subject to a particular periodic excitation. This interesting finding was, however, left unexplained. Bistability is the simplest form of local fading memory. In a system, endowed with local fading memory under a given stimulus, the initial condition does not affect the long-term behaviour of the state as long as it is drawn from the basin of attraction of either of the distinct coexisting state-space attractors (two limit cycles for the periodically forced memristor acting as a bistable oscillator). Here, the history of the system, encoded in the initial condition, is, thus, erasable only locally through ad hoc stimulation. Motivated by the discovery of local history erase effects in our resistive random access memory cell, this study applies a powerful system-theoretic tool, enabling the analysis of the response of first-order systems to square pulse train-based periodic stimuli, known as the time-average state dynamic route, to an accurate physics-based mathematical model, earlier fitted to the nano-device, to determine a strategy for specifying the parameters of an excitation signal, consisting of the sequence of two square pulses of opposite polarity per period so as to induce various forms of monostability or multistability in the non-volatile memristor. In particular, as an absolute novelty in the literature, experimental measurements validate the theoretical prediction on the capability of the device to operate as one of two distinct oscillators, depending upon the initial condition, under a specific pulse train excitation signal. The coexistence of multiple oscillatory operating modes in the periodically forced resistive random access memory cell, an example par excellence of their unique non-linear dynamics, may inspire the development and circuit implementation of novel sensing and mem-computing paradigms.
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TaOx ReRAM 对脉冲序列刺激的振荡响应双稳态理论-实验分析
渐变记忆是指物理系统在受到某类输入刺激时,无论初始条件如何,都能接近一种独特的渐变行为。交流周期类的标准刺激通常会在非易失性忆阻器中诱发渐变记忆效应,这早在 2016 年就被首次发现。最近,对 TaOx 电阻式随机存取存储器单元中电阻开关现象的深入研究表明,当受到特定的周期性激励时,纳米器件能够根据初始条件表现出两种可能的振荡行为之一。然而,这一有趣的发现却没有得到解释。双稳态是局部消逝记忆的最简单形式。在一个系统中,如果在给定的刺激下具有局部消逝记忆,那么只要初始条件来自于共存的不同状态空间吸引子中的任何一个吸引子(作为双稳态振荡器的周期性强迫记忆晶闸管的两个极限周期),就不会影响状态的长期行为。在这里,系统的历史被编码在初始条件中,因此只能通过特别刺激在局部消除。受在电阻式随机存取存储器单元中发现的局部历史擦除效应的启发,本研究应用了一种强大的系统理论工具,即时间平均状态动态路线,来分析一阶系统对基于方波脉冲序列的周期性刺激的响应、本研究将基于物理学的精确数学模型应用于纳米器件,以确定指定激励信号参数的策略,激励信号由每周期两个极性相反的方形脉冲序列组成,从而诱导非易失性忆阻器产生各种形式的单稳态或多稳态。特别值得一提的是,实验测量验证了理论预测,即在特定的脉冲序列激励信号下,根据初始条件,该装置能够作为两种不同振荡器之一运行,这在文献中绝对是一个新发现。周期性受迫电阻随机存取存储器单元中多种振荡工作模式的共存,是其独特非线性动力学的杰出范例,可能会激发新型传感和存储计算范例的开发和电路实施。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Frontiers in Nanotechnology
Frontiers in Nanotechnology Engineering-Electrical and Electronic Engineering
CiteScore
7.10
自引率
0.00%
发文量
96
审稿时长
13 weeks
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