Prasoon Patidar, Tricia J. Ngoon, John Zimmerman, Amy Ogan, Yuvraj Agarwal
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引用次数: 0
Abstract
Ambient classroom sensing systems offer a scalable and non-intrusive way to find connections between instructor actions and student behaviors, creating data that can improve teaching and learning. While these systems effectively provide aggregate data, getting reliable individual student-level information is difficult due to occlusion or movements. Individual data can help in understanding equitable student participation, but it requires identifiable data or individual instrumentation. We propose ClassID, a data attribution method for within a class session and across multiple sessions of a course without these constraints. For within-session, our approach assigns unique identifiers to 98% of students with 95% accuracy. It significantly reduces multiple ID assignments compared to the baseline approach (3 vs. 167) based on our testing on data from 15 classroom sessions. For across-session attributions, our approach, combined with student attendance, shows higher precision than the state-of-the-art approach (85% vs. 44%) on three courses. Finally, we present a set of four use cases to demonstrate how individual behavior attribution can enable a rich set of learning analytics, which is not possible with aggregate data alone.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
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