Seda Kın Barka , Günay Başar , Sophie Kröger , Gönül Başar
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引用次数: 0
Abstract
A combination of optogalvanic spectroscopy and laser-induced fluorescence spectroscopy with a continuous wave tunable single mode Ti-Sa laser was applied to find new energy levels of atomic holmium. Free and excited holmium atoms were produced in a liquid nitrogen-cooled hollow-cathode lamp. In this study, we examined 35 spectral lines of Ho I in the near-infrared wavelength range from 698 nm to 833 nm. Altogether, 16 new energy levels have been discovered, 5 levels of even parity and 11 levels of odd parity. Another four energy levels have been discovered but have already been published by another research group. Data on the hyperfine structure for the new levels are presented. Additionally, hyperfine structure data of three known levels of even parity were determined for the first time. The existence of the new energy levels was confirmed by analyzing 60 lines of previously measured Fourier transform spectra to precisely determine the energy of the levels.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.