Risk Factors for Pressure Ulcer by Electrodes in Long-term Electroencephalography Monitoring

Keuntae Kim, Yong-won Cho
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Abstract

Background: Although electroencephalography is known as non-invasive, long-term electroencephalography monitoring has a significant risk of pressure ulcers caused by electrodes. We investigated the incidence and risk factors of pressure ulcers in long-term electroencephalography monitoring for more than 24 hours.Methods: All patients who underwent long-term electroencephalography monitoring for more than 24 hours from January 2020 to December 2021 were reviewed. Their medical records were reviewed to evaluate the risk factors for pressure ulcers by electroencephalography electrodes. All patients were divided into the presence (lesion positive) and absence (lesion negative) of pressure ulcers confirmed by a clinician.Results: A total of 541 patients were analyzed in this study. Their mean age was 56.0±21.5, and the average duration of the long-term electroencephalography monitoring was 118.0±68.6 hours. Pressure ulcers were identified in 49 patients (9.1%). The odds ratios of age and recording time were 1.032 (95% confidence interval [CI], 1.008-1.056, p=0.009) and 1.022 (95% CI, 1.015-1.029, p<0.001), respectively. The odds ratio of pressure ulcer was 2.702 (95% CI, 1.461-4.999, p=0.002) in patients with comatose mentality (1 point for eye response of Glasgow coma scale).Conclusions: The pressure ulcers caused by electrodes in long-term electroencephalography monitoring can be preventable with due diligence in clinical settings. Risk factor control to prevent pressure ulcers due to electroencephalography electrodes is needed.
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长期脑电图监测中电极压疮的风险因素
背景:虽然脑电图被认为是无创的,但长期脑电图监测存在电极导致压疮的重大风险。我们调查了长期接受脑电图监测超过 24 小时的患者压疮的发生率和风险因素:方法:对 2020 年 1 月至 2021 年 12 月期间接受长期脑电图监测超过 24 小时的所有患者进行回顾性研究。方法:对 2020 年 1 月至 2021 年 12 月期间接受长期脑电图监测超过 24 小时的所有患者进行回顾性分析,通过脑电图电极评估压疮的风险因素。经临床医生确认,所有患者均被分为存在压疮(病变阳性)和不存在压疮(病变阴性):本研究共分析了 541 名患者。他们的平均年龄为(56.0±21.5)岁,长期脑电图监测的平均持续时间为(118.0±68.6)小时。49名患者(9.1%)出现压疮。年龄和记录时间的几率比分别为 1.032(95% 置信区间 [CI],1.008-1.056,p=0.009)和 1.022(95% CI,1.015-1.029,p<0.001)。昏迷患者(格拉斯哥昏迷量表眼部反应为 1 分)发生压疮的几率比为 2.702(95% CI,1.461-4.999,p=0.002):结论:长期脑电图监测中电极导致的压疮是可以预防的,只要在临床上尽职尽责。需要控制风险因素,预防脑电图电极导致的压疮。
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