Review of: "focused ion beam technology has become very popular for performing special tasks such as cross-sectional imaging, preparation of nanodevice layers, nanopatterning of materials, and circuit editing"
{"title":"Review of: \"focused ion beam technology has become very popular for performing special tasks such as cross-sectional imaging, preparation of nanodevice layers, nanopatterning of materials, and circuit editing\"","authors":"Melina Parker","doi":"10.32388/4e4o01","DOIUrl":null,"url":null,"abstract":"<jats:p/>","PeriodicalId":503632,"journal":{"name":"Qeios","volume":"9 31","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Qeios","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.32388/4e4o01","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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