Laser myth busting

Andreas Rudolf, Christof Blumenstein
{"title":"Laser myth busting","authors":"Andreas Rudolf,&nbsp;Christof Blumenstein","doi":"10.1002/phvs.202400020","DOIUrl":null,"url":null,"abstract":"<p>High-power laser systems are routinely employed as production tools, but the laser beam itself is sensitive to various disturbances, especially in the light of current trends toward extreme power and high beam quality. Suitable tools are available to characterize the process-relevant beam parameters – from power through focus dimensions to scanner-imposed properties. Yet either the challenges or the measurement tools tend to be underestimated – justifying a closer look at some of the common myths.</p>","PeriodicalId":101021,"journal":{"name":"PhotonicsViews","volume":"21 3","pages":"37-41"},"PeriodicalIF":0.0000,"publicationDate":"2024-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/phvs.202400020","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"PhotonicsViews","FirstCategoryId":"1085","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/phvs.202400020","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

High-power laser systems are routinely employed as production tools, but the laser beam itself is sensitive to various disturbances, especially in the light of current trends toward extreme power and high beam quality. Suitable tools are available to characterize the process-relevant beam parameters – from power through focus dimensions to scanner-imposed properties. Yet either the challenges or the measurement tools tend to be underestimated – justifying a closer look at some of the common myths.

查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
激光神话破灭
高功率激光系统通常被用作生产工具,但激光光束本身对各种干扰非常敏感,特别是在当前追求极高功率和高光束质量的趋势下。目前已经有合适的工具来表征与工艺相关的光束参数--从功率到聚焦尺寸,再到扫描仪施加的属性。然而,无论是挑战还是测量工具都往往被低估,这就需要对一些常见的误解进行更深入的研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Calendar SiC high-tech ceramics — a comparison of laser processes Ultraviolet line structuring of large solar wafers Raman spectroscopy and imaging in bio and life sciences Industrial-grade 2-μm ultrafast fiber laser CPA for silicon processing
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1