{"title":"Reciprocal space x-ray computed tomography","authors":"Arturas Vailionis, Liyan Wu, Jonathan E. Spanier","doi":"10.1063/5.0203995","DOIUrl":null,"url":null,"abstract":"Three-dimensional reciprocal space mapping (3D-RSM) offers crucial insights into the intricate microstructural properties of materials, including spatial domain distribution, directional long-range ordering, multilayer-substrate mismatch, layer tilting, and defect structure. Traditionally, 3D-RSMs are conducted at synchrotron facilities where instrumental resolution is constrained in all three directions. Lab-based sources have often been considered suboptimal for 3D-RSM measurements due to poor instrumental resolution along the axial direction. However, we demonstrate that, by employing three-dimensional reciprocal space x-ray computed tomography (RS-XCT), the same perceived limitation in resolution can be effectively leveraged to acquire high quality 3D-RSMs. Through a combination of ultrafast reciprocal space mapping and computed tomography reconstruction routines, lab-based 3D-RSMs achieve resolutions comparable to those obtained with synchrotron-based techniques. RS-XCT introduces a practical modality for lab-based x-ray diffractometers, enabling high-resolution 3D-RSM measurements on a variety of materials exhibiting complex three-dimensional scattering landscapes in reciprocal space.","PeriodicalId":7985,"journal":{"name":"APL Materials","volume":"46 1","pages":""},"PeriodicalIF":5.3000,"publicationDate":"2024-05-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"APL Materials","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1063/5.0203995","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
Three-dimensional reciprocal space mapping (3D-RSM) offers crucial insights into the intricate microstructural properties of materials, including spatial domain distribution, directional long-range ordering, multilayer-substrate mismatch, layer tilting, and defect structure. Traditionally, 3D-RSMs are conducted at synchrotron facilities where instrumental resolution is constrained in all three directions. Lab-based sources have often been considered suboptimal for 3D-RSM measurements due to poor instrumental resolution along the axial direction. However, we demonstrate that, by employing three-dimensional reciprocal space x-ray computed tomography (RS-XCT), the same perceived limitation in resolution can be effectively leveraged to acquire high quality 3D-RSMs. Through a combination of ultrafast reciprocal space mapping and computed tomography reconstruction routines, lab-based 3D-RSMs achieve resolutions comparable to those obtained with synchrotron-based techniques. RS-XCT introduces a practical modality for lab-based x-ray diffractometers, enabling high-resolution 3D-RSM measurements on a variety of materials exhibiting complex three-dimensional scattering landscapes in reciprocal space.
期刊介绍:
APL Materials features original, experimental research on significant topical issues within the field of materials science. In order to highlight research at the forefront of materials science, emphasis is given to the quality and timeliness of the work. The journal considers theory or calculation when the work is particularly timely and relevant to applications.
In addition to regular articles, the journal also publishes Special Topics, which report on cutting-edge areas in materials science, such as Perovskite Solar Cells, 2D Materials, and Beyond Lithium Ion Batteries.