Y. Djenouri, Gautam Srivastava, Jerry Chun‐Wei Lin
{"title":"Applied AI in Defect Detection for Additive Manufacturing: Current Literature, Metrics, Datasets, and Open Challenges","authors":"Y. Djenouri, Gautam Srivastava, Jerry Chun‐Wei Lin","doi":"10.1109/MIM.2024.10540405","DOIUrl":null,"url":null,"abstract":"Defect detection in additive manufacturing refers to the evaluation of collected industrial images and the identification of parts that cause anomalies to optimize decision-making in an industrial production context. The advent of the Internet of Things and the widespread installation of electronic sensors, such as image sensors in industrial production lines, have expanded the processing capabilities of analytics tools. By extracting visual information via convolutional operations, deep learning-based algorithms have recently overcome drawbacks of traditional machine learning methods. This paper provides an analysis of contemporary defect detection techniques based on deep learning. Existing methods for defect detection algorithms in additive manufacturing are discussed. In terms of potential research to improve defect detection in additive manufacturing, the difficulties and emerging trends related to defect detection through deep learning are also outlined.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Instrumentation & Measurement Magazine","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/MIM.2024.10540405","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Defect detection in additive manufacturing refers to the evaluation of collected industrial images and the identification of parts that cause anomalies to optimize decision-making in an industrial production context. The advent of the Internet of Things and the widespread installation of electronic sensors, such as image sensors in industrial production lines, have expanded the processing capabilities of analytics tools. By extracting visual information via convolutional operations, deep learning-based algorithms have recently overcome drawbacks of traditional machine learning methods. This paper provides an analysis of contemporary defect detection techniques based on deep learning. Existing methods for defect detection algorithms in additive manufacturing are discussed. In terms of potential research to improve defect detection in additive manufacturing, the difficulties and emerging trends related to defect detection through deep learning are also outlined.
期刊介绍:
IEEE Instrumentation & Measurement Magazine is a bimonthly publication. It publishes in February, April, June, August, October, and December of each year. The magazine covers a wide variety of topics in instrumentation, measurement, and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in instrumentation and measurement.