Determination of Optimal Sample Length for Passive Intermodulation Measurements in Microstrip Lines with Non-Contact Connections

IF 0.3 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC IEICE Communications Express Pub Date : 2024-04-08 DOI:10.23919/comex.2024XBL0026
Musashi Shirakawa;Ryunosuke Murofushi;Nobuhiro Kuga;Eiji Hanayama
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Abstract

In the passive intermodulation (PIM) measurement of microstrip lines using non-contact planar connector, this letter presents a proper sample length for the 3rd-order PIM measurement due to closely frequency-spaced transmission waves. Our experimental study using nickel-plated samples as a distributed PIM source reveals that a spacing between non-contact connectors should be a quarter guided wavelength in order to suppress the effect of non-contact connectors on the PIM measurement results and maximize the observed reverse PIM. We also demonstrate a circuit-network simulation using the harmonic balance method, which agrees well with and validates the experiments.
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确定非接触连接微带线无源互调测量的最佳采样长度
在使用非接触式平面连接器对微带线进行无源互调(PIM)测量时,本文提出了测量频率间隔较近的传输波引起的三阶 PIM 的合适样品长度。我们使用镀镍样品作为分布式 PIM 源进行的实验研究表明,非接触式连接器之间的间距应为四分之一导波波长,这样才能抑制非接触式连接器对 PIM 测量结果的影响,并最大限度地观测到反向 PIM。我们还演示了使用谐波平衡法进行的电路网络仿真,该仿真与实验结果非常吻合,并验证了实验结果。
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来源期刊
IEICE Communications Express
IEICE Communications Express ENGINEERING, ELECTRICAL & ELECTRONIC-
自引率
33.30%
发文量
114
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