Implications of size dispersion on X-ray scattering of crystalline nanoparticles: CeO2 as a case study.

IF 6.1 3区 材料科学 Q1 Biochemistry, Genetics and Molecular Biology Journal of Applied Crystallography Pub Date : 2024-05-31 eCollection Date: 2024-06-01 DOI:10.1107/S1600576724003108
Adriana Valério, Fabiane J Trindade, Rafaela F S Penacchio, Bria Cisi, Sérgio Damasceno, Maurício B Estradiote, Cristiane B Rodella, Andre S Ferlauto, Stefan W Kycia, Sérgio L Morelhão
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Abstract

Controlling the shape and size dispersivity and crystallinity of nanoparticles (NPs) has been a challenge in identifying these parameters' role in the physical and chemical properties of NPs. The need for reliable quantitative tools for analyzing the dispersivity and crystallinity of NPs is a considerable problem in optimizing scalable synthesis routes capable of controlling NP properties. The most common tools are electron microscopy (EM) and X-ray scattering techniques. However, each technique has different susceptibility to these parameters, implying that more than one technique is necessary to characterize NP systems with maximum reliability. Wide-angle X-ray scattering (WAXS) is mandatory to access information on crystallinity. In contrast, EM or small-angle X-ray scattering (SAXS) is required to access information on whole NP sizes. EM provides average values on relatively small ensembles in contrast to the bulk values accessed by X-ray techniques. Besides the fact that the SAXS and WAXS techniques have different susceptibilities to size distributions, SAXS is easily affected by NP-NP interaction distances. Because of all the variables involved, there have yet to be proposed methodologies for cross-analyzing data from two techniques that can provide reliable quantitative results of dispersivity and crystallinity. In this work, a SAXS/WAXS-based methodology is proposed for simultaneously quantifying size distribution and degree of crystallinity of NPs. The most reliable easy-to-access size result for each technique is demonstrated by computer simulation. Strategies on how to compare these results and how to identify NP-NP interaction effects underneath the SAXS intensity curve are presented. Experimental results are shown for cubic-like CeO2 NPs. WAXS size results from two analytical procedures are compared, line-profile fitting of individual diffraction peaks in opposition to whole pattern fitting. The impact of shape dispersivity is also evaluated. Extension of the proposed methodology for cross-analyzing EM and WAXS data is possible.

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尺寸分散对晶体纳米粒子 X 射线散射的影响:以 CeO2 为例进行研究。
控制纳米粒子(NPs)的形状和尺寸分散性及结晶度一直是确定这些参数在 NPs 物理和化学特性中的作用所面临的挑战。需要可靠的定量工具来分析 NPs 的分散性和结晶性,这是优化可控制 NP 特性的可扩展合成路线的一个重大问题。最常用的工具是电子显微镜(EM)和 X 射线散射技术。然而,每种技术对这些参数的敏感性不同,这意味着需要一种以上的技术才能以最大的可靠性表征 NP 系统。广角 X 射线散射 (WAXS) 是获取结晶度信息的必备技术。相反,要获取整个 NP 尺寸的信息,则需要 EM 或小角 X 射线散射 (SAXS)。与 X 射线技术获取的整体值相比,EM 可提供相对较小集合的平均值。除了 SAXS 和 WAXS 技术对尺寸分布的敏感性不同之外,SAXS 还容易受到 NP-NP 相互作用距离的影响。由于涉及到所有变量,目前还没有一种方法可用于交叉分析来自两种技术的数据,从而提供可靠的分散性和结晶度定量结果。本研究提出了一种基于 SAXS/WAXS 的方法,用于同时量化 NPs 的尺寸分布和结晶度。通过计算机模拟,证明了每种技术最可靠易得的粒度结果。此外,还介绍了如何比较这些结果以及如何识别 SAXS 强度曲线下的 NP-NP 相互作用效应的策略。实验结果显示的是立方体类 CeO2 NPs。比较了两种分析程序得出的 WAXS 尺寸结果,即单个衍射峰的线轮廓拟合与整个图案拟合。同时还评估了形状分散性的影响。建议的交叉分析电磁和 WAXS 数据的方法可以进行扩展。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
10.00
自引率
3.30%
发文量
178
审稿时长
4.7 months
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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