New procedure for CSigma laser induced breakdown spectroscopy addressing the laser-induced plasma inhomogeneity

IF 3.2 2区 化学 Q1 SPECTROSCOPY Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2024-06-06 DOI:10.1016/j.sab.2024.106969
J.A. Aguilera, C. Aragón
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Abstract

CSigma laser-induced breakdown spectroscopy (Cσ-LIBS), as the other methods for quantitative elemental analysis by LIBS based on plasma characterization, is negatively affected by the inhomogeneity of laser-induced plasmas. In the present work, we propose a new procedure for Cσ-LIBS which addresses the plasma inhomogeneity problem. The key features of the method are: (1) the extension of the concept of apparent temperature to other plasma parameters (apparent plasma) and its use in both the ionization and excitation equilibria and (2) the addition to the theoretical Cσ curve of a linear contribution arising from the plasma regions of low optical depth. In ionization equilibrium, the inhomogeneity requires separated Cσ graphs and different apparent ionization temperatures for neutral atom and ion emissions. In excitation equilibrium, we account for the inhomogeneity by obtaining a different apparent temperature for each multiplet included in the Cσ graph. In this way, the procedure only requires the fitting of a limited number of parameters to describe the inhomogeneous plasma, as the multiplet temperatures Ti are determined by a straightforward iteration procedure of fast convergence. The improved treatment of plasma inhomogeneity allows to include intense resonance lines in Cσ graphs, which were previously avoided. The development of the method has demanded accurate experimental Cσ graphs, obtained with seven certified aluminum alloys. The laser-induced plasma is generated in air at atmospheric pressure, the most common and versatile ambient gas condition for LIBS, which is known to produce a strongly inhomogeneous plasma. To validate the analytical application of the method, the samples are divided into three characterization samples and four analytical samples. The average deviation of the determined concentrations from the certified values has been 8.5% for elements with concentrations greater than 0.05 wt%.

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解决激光诱导等离子体不均匀性的 CSigma 激光诱导击穿光谱仪新程序
CSigma 激光诱导击穿光谱(Cσ-LIBS)与其他基于等离子体表征的 LIBS 定量元素分析方法一样,会受到激光诱导等离子体不均匀性的负面影响。在本研究中,我们提出了一种解决等离子体不均匀性问题的 Cσ-LIBS 新程序。该方法的主要特点是(1) 将视向温度的概念扩展到其他等离子体参数(视向等离子体),并将其用于电离平衡和激发平衡;(2) 在理论 Cσ 曲线上增加低光学深度等离子体区域的线性贡献。在电离平衡中,不均匀性要求中性原子和离子发射的 Cσ 曲线和表观电离温度各不相同。在激发平衡中,我们通过为 Cσ 图中的每个多重子获得不同的表观温度来考虑不均匀性。这样,该程序只需要拟合数量有限的参数来描述不均匀等离子体,因为多子温度 Ti 是通过快速收敛的直接迭代程序确定的。对等离子体非均质性的改进处理使得 Cσ 图中可以包含强烈的共振线,而这在以前是无法实现的。该方法的开发需要精确的实验 Cσ 图,这些 Cσ 图是用七种经认证的铝合金获得的。激光诱导等离子体是在大气压下的空气中产生的,这是 LIBS 最常见和最通用的环境气体条件,已知会产生强烈的不均匀等离子体。为了验证该方法的分析应用,样品被分为三个表征样品和四个分析样品。对于浓度大于 0.05 wt% 的元素,测定浓度与认证值的平均偏差为 8.5%。
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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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