Elnaz Vakili, G. Karimian, M. Shoaran, Reza Yadipour, J. Sobhi
{"title":"Valid-IoU: an improved IoU-based loss function and its application to detection of defects on printed circuit boards","authors":"Elnaz Vakili, G. Karimian, M. Shoaran, Reza Yadipour, J. Sobhi","doi":"10.1007/s11042-024-19482-4","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":506090,"journal":{"name":"Multimedia Tools and Applications","volume":"60 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Multimedia Tools and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s11042-024-19482-4","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
