Well-Posedness and Hyers–Ulam Stability of Fractional Stochastic Delay Systems Governed by the Rosenblatt Process

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-06-06 DOI:10.3390/fractalfract8060342
Ghada AlNemer, Mohamed Hosny, R. Udhayakumar, Ahmed M. Elshenhab
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Abstract

Under the effect of the Rosenblatt process, the well-posedness and Hyers–Ulam stability of nonlinear fractional stochastic delay systems are considered. First, depending on fixed-point theory, the existence and uniqueness of solutions are proven. Next, utilizing the delayed Mittag–Leffler matrix functions and Grönwall’s inequality, sufficient criteria for Hyers–Ulam stability are established. Ultimately, an example is presented to demonstrate the effectiveness of the obtained findings.
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罗森布拉特过程控制的分数随机延迟系统的良好假设性和海尔-乌兰稳定性
在罗森布拉特过程的作用下,研究了非线性分数随机延迟系统的好求性和海尔-乌兰稳定性。首先,根据定点理论证明了解的存在性和唯一性。接着,利用延迟 Mittag-Leffler 矩阵函数和 Grönwall 不等式,建立了海尔-乌兰稳定性的充分标准。最后,介绍了一个实例来证明所获结论的有效性。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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