An Approach Toward Broader Emission Bands in Semipolar InGaN Quantum Wells on Convex Lens‐Shaped GaN Microstructures via Lower‐Temperature Growth

Shogo Fukushige, Y. Matsuda, M. Funato, Y. Kawakami
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Abstract

InGaN quantum wells (QWs) are grown at different temperatures on convex lens‐shaped GaN microstructures formed on the () plane. Microlens QWs grown at different temperatures have centrosymmetric convex lens shapes, and the wavelength spatial distributions within the structures exhibit similar tendencies. However, lowering the growth temperature broadens the wavelength range of room‐temperature cathodoluminescence spectra from the microlens QWs as ≈70 nm for ≈700 °C, ≈100 nm for ≈660 °C, and ≈150 nm for ≈650 °C. Peak wavelength profiles of the two orthogonal lines along [] and [] indicate that the broader emission bands are mainly due to the significant spatial distribution of the emission wavelength along the [] direction. Because the QW thickness variations are nearly the same along [] and [], the observed difference in the emission wavelength distributions along those directions is attributed to the difference in In incorporation, which is determined by the competition among the growth rate, crystal orientation, and growth temperature.
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通过低温生长在凸透镜形 GaN 微结构上实现半极性 InGaN 量子阱更宽发射带的方法
在()平面上形成的凸透镜形 GaN 微结构上,在不同温度下生长出 InGaN 量子阱(QW)。在不同温度下生长的微透镜 QW 具有中心对称的凸透镜形状,结构内的波长空间分布也呈现出相似的趋势。然而,降低生长温度会拓宽微透镜 QW 的室温阴极发光光谱波长范围:≈700 ℃ 时≈70 nm,≈660 ℃ 时≈100 nm,≈650 ℃ 时≈150 nm。沿[]和[]两条正交线的峰值波长曲线表明,较宽的发射带主要是由于沿[]方向的发射波长空间分布明显。由于沿[]和[]方向的 QW 厚度变化几乎相同,因此沿这些方向观察到的发射波长分布差异可归因于铟掺入量的不同,而铟掺入量是由生长速率、晶体取向和生长温度之间的竞争决定的。
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