{"title":"Monitoring the operating state of crystal growth process based on digital twin model","authors":"Yu-Yu Liu , Ling-Xia Mu , Ding Liu","doi":"10.1016/j.jprocont.2024.103261","DOIUrl":null,"url":null,"abstract":"<div><p>The reliable assessment of the operational status during the silicon single crystal growth process is a prerequisite for ensuring system safety and improving crystal quality. However, in the actual silicon single crystal growth process, due to limitations in manpower, material resources, financial resources, and current technical methods, the establishment of monitoring models is still in its infancy. To address this issue, this paper proposes a hybrid deep belief network (HDBN) algorithm aided by the digital twin (DT) model to achieve real-time monitoring of equipment operational status. Firstly, this study constructs the DT model based on the basic principles of crystal growth, mainly to achieve high-precision simulation of the actual silicon single crystal growth process and generate abnormal data for the equipment. This operation can expand the sample set, enhance the diversity and coverage of data, and effectively solve the problem of insufficient sample size. Secondly, this study uses the variational mode decomposition (VMD) algorithm to decompose the dataset composed of obtained abnormal and normal data, and constructs sub-deep belief network (DBN) for the decomposed subsequences to capture deep feature information at different frequencies of the data. Subsequently, based on the concept of ensemble learning, the outputs of each sub-DBN network are used as inputs to construct the overall DBN network, achieving monitoring of the equipment operational status. Through the combination of VMD decomposition and DBN networks, this algorithm can better capture the frequency characteristics and time-domain features of the signal, enhancing monitoring accuracy. Experimental results show that this algorithm can accurately identify abnormal equipment states, effectively improve monitoring performance, and is of significant importance for the optimization and control of the semiconductor-grade silicon single crystal growth process, contributing to increased production efficiency and product quality.</p></div>","PeriodicalId":50079,"journal":{"name":"Journal of Process Control","volume":"140 ","pages":"Article 103261"},"PeriodicalIF":3.3000,"publicationDate":"2024-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Process Control","FirstCategoryId":"94","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S095915242400101X","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
The reliable assessment of the operational status during the silicon single crystal growth process is a prerequisite for ensuring system safety and improving crystal quality. However, in the actual silicon single crystal growth process, due to limitations in manpower, material resources, financial resources, and current technical methods, the establishment of monitoring models is still in its infancy. To address this issue, this paper proposes a hybrid deep belief network (HDBN) algorithm aided by the digital twin (DT) model to achieve real-time monitoring of equipment operational status. Firstly, this study constructs the DT model based on the basic principles of crystal growth, mainly to achieve high-precision simulation of the actual silicon single crystal growth process and generate abnormal data for the equipment. This operation can expand the sample set, enhance the diversity and coverage of data, and effectively solve the problem of insufficient sample size. Secondly, this study uses the variational mode decomposition (VMD) algorithm to decompose the dataset composed of obtained abnormal and normal data, and constructs sub-deep belief network (DBN) for the decomposed subsequences to capture deep feature information at different frequencies of the data. Subsequently, based on the concept of ensemble learning, the outputs of each sub-DBN network are used as inputs to construct the overall DBN network, achieving monitoring of the equipment operational status. Through the combination of VMD decomposition and DBN networks, this algorithm can better capture the frequency characteristics and time-domain features of the signal, enhancing monitoring accuracy. Experimental results show that this algorithm can accurately identify abnormal equipment states, effectively improve monitoring performance, and is of significant importance for the optimization and control of the semiconductor-grade silicon single crystal growth process, contributing to increased production efficiency and product quality.
期刊介绍:
This international journal covers the application of control theory, operations research, computer science and engineering principles to the solution of process control problems. In addition to the traditional chemical processing and manufacturing applications, the scope of process control problems involves a wide range of applications that includes energy processes, nano-technology, systems biology, bio-medical engineering, pharmaceutical processing technology, energy storage and conversion, smart grid, and data analytics among others.
Papers on the theory in these areas will also be accepted provided the theoretical contribution is aimed at the application and the development of process control techniques.
Topics covered include:
• Control applications• Process monitoring• Plant-wide control• Process control systems• Control techniques and algorithms• Process modelling and simulation• Design methods
Advanced design methods exclude well established and widely studied traditional design techniques such as PID tuning and its many variants. Applications in fields such as control of automotive engines, machinery and robotics are not deemed suitable unless a clear motivation for the relevance to process control is provided.