Surface transfer doping of hydrogen-terminated diamond probed by shallow nitrogen-vacancy centers

IF 10.5 2区 材料科学 Q1 CHEMISTRY, PHYSICAL Carbon Pub Date : 2024-07-02 DOI:10.1016/j.carbon.2024.119404
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Abstract

The surface conductivity of hydrogen-terminated diamond is a topic of great interest from both scientific and technological perspectives. This is primarily due to the fact that the conductivity is exceptionally high without the need for substitutional doping, thus enabling a wide range of electronic applications. Although the conductivity is commonly explained by surface transfer doping due to air-borne surface acceptors, there remains uncertainty regarding the main determining factors that govern the degree of band bending and hole density, which are crucial for the design of electronic devices. Here, we elucidate the dominant factor influencing band bending by creating shallow nitrogen-vacancy (NV) centers beneath the hydrogen-terminated diamond surface through nitrogen ion implantation at varying fluences. We measured the photoluminescence and optically detected magnetic resonance (ODMR) of the NV centers, as well as the surface conductivity, as a function of the nitrogen implantation fluence. The disappearance of the conductivity with increasing nitrogen implantation fluence coincides with the appearance of photoluminescence and ODMR signals from negatively charged NV centers. This finding indicates that band bending is not exclusively determined by the work-function difference between diamond and the surface acceptor material, but by the finite density of surface acceptors. This work emphasizes the importance of distinguishing work-function-difference-limited band bending and surface-acceptor-density-limited band bending when modeling the surface transfer doping, and provides useful insights for the development of devices based on hydrogen-terminated diamond.

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通过浅层氮空位中心探测氢端金刚石的表面转移掺杂
从科学和技术的角度来看,氢端金刚石的表面电导率都是一个备受关注的话题。这主要是因为氢端金刚石的电导率极高,无需替代掺杂,因此可广泛应用于电子领域。虽然导电性通常是由空气中的表面受体导致的表面转移掺杂造成的,但对于电子器件设计至关重要的能带弯曲程度和空穴密度的主要决定因素仍存在不确定性。在这里,我们通过不同通量的氮离子注入,在氢端金刚石表面下形成浅层氮空位(NV)中心,从而阐明了影响带弯曲的主要因素。我们测量了 NV 中心的光致发光和光学检测磁共振 (ODMR) 以及表面电导率与氮离子注入通量的函数关系。电导率随着氮植入通量的增加而消失,这与带负电的 NV 中心的光致发光和 ODMR 信号的出现相吻合。这一发现表明,带弯曲不完全是由金刚石和表面受体材料之间的功函数差异决定的,而是由表面受体的有限密度决定的。这项研究强调了在建立表面转移掺杂模型时区分功函数差限制带弯曲和表面受体密度限制带弯曲的重要性,并为开发基于氢端金刚石的器件提供了有益的启示。
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来源期刊
Carbon
Carbon 工程技术-材料科学:综合
CiteScore
20.80
自引率
7.30%
发文量
0
审稿时长
23 days
期刊介绍: The journal Carbon is an international multidisciplinary forum for communicating scientific advances in the field of carbon materials. It reports new findings related to the formation, structure, properties, behaviors, and technological applications of carbons. Carbons are a broad class of ordered or disordered solid phases composed primarily of elemental carbon, including but not limited to carbon black, carbon fibers and filaments, carbon nanotubes, diamond and diamond-like carbon, fullerenes, glassy carbon, graphite, graphene, graphene-oxide, porous carbons, pyrolytic carbon, and other sp2 and non-sp2 hybridized carbon systems. Carbon is the companion title to the open access journal Carbon Trends. Relevant application areas for carbon materials include biology and medicine, catalysis, electronic, optoelectronic, spintronic, high-frequency, and photonic devices, energy storage and conversion systems, environmental applications and water treatment, smart materials and systems, and structural and thermal applications.
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