D. A. Zolotov, A. V. Buzmakov, I. G. Dyachkova, Yu. S. Krivonosov, Yu. I. Dudchik, V. E. Asadchikov
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引用次数: 0
Abstract
A brief retrospective of the development of laboratory X-ray microtomography at the Shubnikov Institute of Crystallography of the Russian Academy of Sciences (IC RAS) is given. The main methods and approaches that made it possible to increase the informativeness of microtomography measurements—the use of monochromatic radiation, phase-contrast method, and diffraction tomography (topo-tomography)—are reported. Designs of the instruments developed and currently functioning at the IC RAS are described, and some experimental results obtained on them are presented.
摘要 简要回顾了俄罗斯科学院舒布尼科夫晶体学研究所（IC RAS）实验室 X 射线显微层析技术的发展历程。报告介绍了提高显微层析测量信息量的主要方法和途径--使用单色辐射、相位对比法和衍射层析（拓扑层析）。此外，还介绍了 IC RAS 研发的、目前正在运行的仪器的设计，以及在这些仪器上取得的一些实验结果。
期刊介绍：
Crystallography Reports is a journal that publishes original articles short communications, and reviews on various aspects of crystallography: diffraction and scattering of X-rays, electrons, and neutrons, determination of crystal structure of inorganic and organic substances, including proteins and other biological substances; UV-VIS and IR spectroscopy; growth, imperfect structure and physical properties of crystals; thin films, liquid crystals, nanomaterials, partially disordered systems, and the methods of studies.
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