{"title":"A note on Maz'ya-Verbitsky capacitary inequalities","authors":"K. H. Ooi","doi":"10.1007/s10476-024-00037-6","DOIUrl":null,"url":null,"abstract":"<div><p>We present a proof of Maz'ya-Verbitsky capacitary inequalities in terms of Bessel potentials. It will be seen that the proof mainly relies on the localization techniques. Several types of Kerman-Sawyer conditions will be obtained throughout the proof as well.</p></div>","PeriodicalId":0,"journal":{"name":"","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2024-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"","FirstCategoryId":"100","ListUrlMain":"https://link.springer.com/article/10.1007/s10476-024-00037-6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We present a proof of Maz'ya-Verbitsky capacitary inequalities in terms of Bessel potentials. It will be seen that the proof mainly relies on the localization techniques. Several types of Kerman-Sawyer conditions will be obtained throughout the proof as well.
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