Portable X-ray fluorescence spectrometry: a cost-effective method for analysing trace metals in deposited dust.

IF 2.7 3区 化学 Q2 CHEMISTRY, ANALYTICAL Analytical Methods Pub Date : 2024-07-25 DOI:10.1039/d4ay00368c
Carlos Ibañez-Del Rivero, Cassandra A Wheeler, Kara L Fry, Mark Patrick Taylor
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Abstract

For projects requiring extensive environmental sampling and rapid decision-making to identify trace metal contamination using dust wipes, the cost and time required for wet chemistry analysis can be prohibitive. Under such circumstances there is a need for a suitable screening method that is cost-effective, efficient, and portable. To address this need, this study investigated the utility of portable X-ray fluorescence (pXRF) for the analysis of trace metals in dust wipes. Here, 316 dust wipe samples from three different geographical settings co-located with mining and smelting operations were investigated for their trace metal loadings (μg m-2) of arsenic (As), chromium (Cr), copper (Cu), iron (Fe), manganese (Mn), nickel (Ni), lead (Pb), and zinc (Zn) using pXRF. Results collected using pXRF were compared against inductively coupled plasma mass spectrometry (ICP-MS) concentrations using matched dust wipes (n = 87) to assess reproducibility. A subset of dust wipes (n = 4) were subject to different pXRF analytical scenarios (ranging from 1 to 12 pXRF measurements) using a standardised test duration of 30 seconds to identify the most efficient number of tests for analytical precision. Conducting four pXRF tests on a single wipe (total exposure time of 120 seconds) returned comparable results to ICP-MS and was adopted for analysis of all samples. Results from dust wipes analysed with both ICP-MS and pXRF (n = 87) showed moderate to strong Spearman Rho correlations (rs = 0.489-0.956, p < 0.01) and linear regression coefficients of variation demonstrated good agreement between methods (R2 = 0.432-0.989, p < 0.05). Linear regression equations were used to correct pXRF data to the ICP-MS dust wipe data for samples analysed by both approaches, and applied to pXRF data that were not subject to ICP-MS analysis (n = 229). Application of the correction formula resulted in a substantial improvement of pXRF's accuracy and precision, confirming its effectiveness for assessing trace metals in dust wipes.

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便携式 X 射线荧光光谱仪:分析沉积尘埃中痕量金属的经济有效方法。
对于需要进行大量环境采样和快速决策以利用擦拭灰尘来识别痕量金属污染的项目,湿化学分析所需的成本和时间可能会令人望而却步。在这种情况下,就需要一种经济、高效、便携的筛选方法。为了满足这一需求,本研究调查了便携式 X 射线荧光 (pXRF) 在分析抹布中痕量金属方面的实用性。在此,研究人员使用 pXRF 分析了来自与采矿和冶炼作业共处的三个不同地理环境的 316 个尘埃擦拭样本中砷(As)、铬(Cr)、铜(Cu)、铁(Fe)、锰(Mn)、镍(Ni)、铅(Pb)和锌(Zn)的痕量金属负荷(μg m-2)。将使用 pXRF 收集的结果与使用匹配抹布(n = 87)的电感耦合等离子体质谱法 (ICP-MS) 浓度进行比较,以评估重现性。利用 30 秒的标准化测试时间,对一部分尘巾(n = 4)进行了不同的 pXRF 分析(pXRF 测量次数从 1 次到 12 次不等),以确定最有效的分析精度测试次数。对一块抹布进行四次 pXRF 测试(总曝光时间为 120 秒)得出的结果与 ICP-MS 的结果相当,因此所有样品都采用这种方法进行分析。同时使用 ICP-MS 和 pXRF(n = 87)分析抹布灰尘的结果显示出中等到较强的 Spearman Rho 相关性(rs = 0.489-0.956,p < 0.01),线性回归变异系数显示出不同方法之间的良好一致性(R2 = 0.432-0.989,p < 0.05)。线性回归方程用于校正两种方法分析的样品的 pXRF 数据和 ICP-MS 灰尘擦拭数据,并应用于未进行 ICP-MS 分析的 pXRF 数据(n = 229)。修正公式的应用大大提高了 pXRF 的准确度和精确度,证实了其在评估擦拭灰尘中的痕量金属方面的有效性。
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来源期刊
Analytical Methods
Analytical Methods CHEMISTRY, ANALYTICAL-FOOD SCIENCE & TECHNOLOGY
CiteScore
5.10
自引率
3.20%
发文量
569
审稿时长
1.8 months
期刊介绍: Early applied demonstrations of new analytical methods with clear societal impact
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