Effect of annealing temperature on the optoelectrical synapse behaviors of A-ZnO microtube.

IF 6.7 0 MATERIALS SCIENCE, MULTIDISCIPLINARY Discover nano Pub Date : 2024-07-13 DOI:10.1186/s11671-024-04060-2
Yongman Pan, Qiang Wang, Anqing He, Yinzhou Yan, Xingzhong Cao, Peng Liu, Yijian Jiang
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Abstract

Optoelectronic synapses with fast response, low power consumption, and memory function hold great potential in the future of artificial intelligence technologies. Herein, a strategy of annealing in oxygen ambient at different temperatures is presented to improve the optoelectronic synaptic behaviors of acceptor-rich ZnO (A-ZnO) microtubes. The basic synaptic functions of as-grown and annealed A-ZnO microtubes including excitatory postsynaptic current (EPSC), short-term memory (STM) to long-term memory (LTM) conversion, and paired-pulse facilitation (PPF), were successfully emulated. The results show that the annealing temperature of 600 °C yields high figures of merit compared to other annealed A-ZnO microtubes. The 4-fold and 20-fold enhancement dependent on the light pulse duration time and energy density have been achieved in the 600 °C annealed A-ZnO microtube, respectively. Furthermore, the device exhibited a PPF index of up to 238% and achieved four cycles of "learning-forgetting" process, proving its capability for optical information storage. The free exciton (FX) and donor-acceptor pair (DAP) concentrations significantly influenced the persistent photoconductivity (PPC) behavior of A-ZnO microtubes. Therefore, the LTM response can be controlled by the adjustment of numbers, powers, and interval time of the optical stimulation. This work outlines a strategy to improve the EPSC response through defect control, representing a step towards applications in the field of optoelectronic synaptic device.

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退火温度对 A-ZnO 微管光电突触行为的影响。
具有快速响应、低功耗和记忆功能的光电突触在未来的人工智能技术中具有巨大潜力。本文提出了一种在氧气环境中不同温度下退火的策略,以改善富受体氧化锌(A-ZnO)微管的光电突触行为。研究人员成功模拟了原样生长和退火后的 A-ZnO 微管的基本突触功能,包括兴奋性突触后电流(EPSC)、短期记忆(STM)到长期记忆(LTM)的转换以及成对脉冲促进(PPF)。结果表明,与其他退火的 A-ZnO 微管相比,600 °C 的退火温度能产生较高的性能指标。在 600 °C 退火的 A-ZnO 微管中,光脉冲持续时间和能量密度分别提高了 4 倍和 20 倍。此外,该器件还显示出高达 238% 的 PPF 指数,并实现了四个周期的 "学习-遗忘 "过程,证明了其在光学信息存储方面的能力。自由激子(FX)和供体-受体对(DAP)浓度对 A-ZnO 微管的持久光电导(PPC)行为有显著影响。因此,可以通过调整光刺激的数量、功率和间隔时间来控制 LTM 响应。这项工作概述了一种通过缺陷控制改善 EPSC 响应的策略,标志着向光电突触器件领域的应用迈出了一步。
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