Test-Retest Reliability of EEG Aperiodic Components in Resting and Mental Task States.

Abstract

Aperiodic activity is derived from the electroencephalography (EEG) power spectrum and reflects changes in the slope and shifts of the broadband spectrum. Studies have shown inconsistent test-retest reliability of the aperiodic components. This study systematically measured how the test-retest reliability of the aperiodic components was affected by data duration (1, 2, 3, 4, and 5 min), states (resting with eyes closed, resting with eyes open, performing mental arithmetic, recalling the events of the day, and mentally singing songs), and methods (the Fitting Oscillations and One-Over-F (FOOOF) and Linear Mixed-Effects Regression (LMER)) at both short (90-min) and long (one-month) intervals. The results showed that aperiodic components had fair, good, or excellent test-retest reliability (ranging from 0.53 to 0.91) at both short and long intervals. It is recommended that better reliability of the aperiodic components be obtained using data durations longer than 3 min, the resting state with eyes closed, the mental arithmetic task state, and the LMER method.