Subgradient-projection-based stable phase-retrieval algorithm for X-ray ptychography

IF 6.1 3区 材料科学 Q1 Biochemistry, Genetics and Molecular Biology Journal of Applied Crystallography Pub Date : 2024-07-04 DOI:10.1107/s1600576724004709
Natsuki Akaishi, Koki Yamada, Kohei Yatabe, Yuki Takayama
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Abstract

X-ray ptychography is a lensless imaging technique that visualizes the nanostructure of a thick specimen which cannot be observed with an electron microscope. It reconstructs a complex-valued refractive index of the specimen from observed diffraction patterns. This reconstruction problem is called phase retrieval (PR). For further improvement in the imaging capability, including expansion of the depth of field, various PR algorithms have been proposed. Since a high-quality PR method is built upon a base PR algorithm such as ePIE, developing a well performing base PR algorithm is important. This paper proposes an improved iterative algorithm named CRISP. It exploits subgradient projection which allows adaptive step size and can be expected to avoid yielding a poor image. The proposed algorithm was compared with ePIE, which is a simple and fast-convergence algorithm, and its modified algorithm, rPIE. The experiments confirmed that the proposed method improved the reconstruction performance for both simulation and real data.
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基于子梯度投影的 X 射线断层扫描稳定相位检索算法
X 射线层析成像技术是一种无透镜成像技术,可观察到电子显微镜无法观察到的厚试样的纳米结构。它根据观察到的衍射图样重建试样的复值折射率。这种重建问题被称为相位检索(PR)。为了进一步提高成像能力,包括扩大景深,人们提出了各种相位检索算法。由于高质量的相位检索方法建立在 ePIE 等基本相位检索算法的基础上,因此开发一种性能良好的基本相位检索算法非常重要。本文提出了一种名为 CRISP 的改进迭代算法。该算法利用子梯度投影,允许自适应步长,可望避免产生不良图像。本文将提出的算法与 ePIE(一种简单、收敛快的算法)及其改进算法 rPIE 进行了比较。实验证实,所提出的方法提高了模拟和真实数据的重建性能。
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来源期刊
CiteScore
10.00
自引率
3.30%
发文量
178
审稿时长
4.7 months
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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