Tong Qu, Changchun Chai, Jiahui Guo, Shuai Wang, Zhuohang Ye, Zehao Li, Xiaojun Liu
{"title":"High dynamic range structured illumination microscopy based on per-pixel coding","authors":"Tong Qu, Changchun Chai, Jiahui Guo, Shuai Wang, Zhuohang Ye, Zehao Li, Xiaojun Liu","doi":"10.1088/1361-6501/ad5747","DOIUrl":null,"url":null,"abstract":"Structured illumination microscopy (SIM) can achieve optical sectioning with high resolution, and have aroused extensive research interest. In SIM, a set of high-contrast illumination patterns are projected onto the sample to modulate the surface height information, and then, a decoding algorithm is applied to the modulated pattern images for high-quality optical sectioning. Applied to samples with large dynamic range of reflectivity, however, SIM may fail to achieve high quality sectioning for accurate surface reconstruction. Herein, an active digital micromirror device (DMD) based illumination method using per-pixel coded strategy is proposed in SIM to realize high-quality measurement for surface with complex reflection characteristics. In this method, the mapping relationship between DMD and the camera is established pixels by pixels, which enables the illumination intensity on the sample surface can be flexibly modulated by DMD pixel-level modulation corresponding to reflectivity distribution of the surface, and allows the camera pixels always to have reasonable exposure intensity for high precision measurement. More importantly, we put forward an adaptive light intensity control algorithm to improves the signal-to-noise ratio of acquired images without compromising modulation depth of pattern and measurement efficiency. Extensive comparative experiments were conducted and demonstrated that the proposed method can retrieve the surface morphology information of micro-scale complex reflectivity surfaces with high accuracy.","PeriodicalId":18526,"journal":{"name":"Measurement Science and Technology","volume":null,"pages":null},"PeriodicalIF":2.7000,"publicationDate":"2024-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Measurement Science and Technology","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1088/1361-6501/ad5747","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
Structured illumination microscopy (SIM) can achieve optical sectioning with high resolution, and have aroused extensive research interest. In SIM, a set of high-contrast illumination patterns are projected onto the sample to modulate the surface height information, and then, a decoding algorithm is applied to the modulated pattern images for high-quality optical sectioning. Applied to samples with large dynamic range of reflectivity, however, SIM may fail to achieve high quality sectioning for accurate surface reconstruction. Herein, an active digital micromirror device (DMD) based illumination method using per-pixel coded strategy is proposed in SIM to realize high-quality measurement for surface with complex reflection characteristics. In this method, the mapping relationship between DMD and the camera is established pixels by pixels, which enables the illumination intensity on the sample surface can be flexibly modulated by DMD pixel-level modulation corresponding to reflectivity distribution of the surface, and allows the camera pixels always to have reasonable exposure intensity for high precision measurement. More importantly, we put forward an adaptive light intensity control algorithm to improves the signal-to-noise ratio of acquired images without compromising modulation depth of pattern and measurement efficiency. Extensive comparative experiments were conducted and demonstrated that the proposed method can retrieve the surface morphology information of micro-scale complex reflectivity surfaces with high accuracy.
期刊介绍:
Measurement Science and Technology publishes articles on new measurement techniques and associated instrumentation. Papers that describe experiments must represent an advance in measurement science or measurement technique rather than the application of established experimental technique. Bearing in mind the multidisciplinary nature of the journal, authors must provide an introduction to their work that makes clear the novelty, significance, broader relevance of their work in a measurement context and relevance to the readership of Measurement Science and Technology. All submitted articles should contain consideration of the uncertainty, precision and/or accuracy of the measurements presented.
Subject coverage includes the theory, practice and application of measurement in physics, chemistry, engineering and the environmental and life sciences from inception to commercial exploitation. Publications in the journal should emphasize the novelty of reported methods, characterize them and demonstrate their performance using examples or applications.