Ahmad Umar, Ahmed A. Ibrahim, Rani Rosaline, N. E. Sneha, Albatoul Mohammed Margan, Fares Almarqan, M. Varsha, Stephen Rajkumar Inbanathan, S. Ansari
{"title":"Synthesis and Enhanced Optical Characterization of Zirconium-Doped NiO Thin Films","authors":"Ahmad Umar, Ahmed A. Ibrahim, Rani Rosaline, N. E. Sneha, Albatoul Mohammed Margan, Fares Almarqan, M. Varsha, Stephen Rajkumar Inbanathan, S. Ansari","doi":"10.1166/jno.2024.3624","DOIUrl":null,"url":null,"abstract":"This study explores the formation and examination of Zr-doped NiO thin films (ZNO). The NiO powders mixed with Zr were made using the chemical precipitation method, and then these powders were shaped into thin films using a technique called the doctor blade method. We used several methods\n to characterize the materials, including X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and ultraviolet spectroscopy. The XRD analysis showed that the films were pure, only displaying the expected peaks for NiO in its common crystal form and no\n signs of contamination. The AFM results indicated that the surface of these films was quite rough. Moreover, the optical studies revealed that adding Zr improved how NiO interacts with light at longer wavelengths, and these Zr-doped films had a lower energy gap (2.88 eV) than usual, which\n could be beneficial for certain applications.","PeriodicalId":16446,"journal":{"name":"Journal of Nanoelectronics and Optoelectronics","volume":null,"pages":null},"PeriodicalIF":0.6000,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Nanoelectronics and Optoelectronics","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1166/jno.2024.3624","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This study explores the formation and examination of Zr-doped NiO thin films (ZNO). The NiO powders mixed with Zr were made using the chemical precipitation method, and then these powders were shaped into thin films using a technique called the doctor blade method. We used several methods
to characterize the materials, including X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and ultraviolet spectroscopy. The XRD analysis showed that the films were pure, only displaying the expected peaks for NiO in its common crystal form and no
signs of contamination. The AFM results indicated that the surface of these films was quite rough. Moreover, the optical studies revealed that adding Zr improved how NiO interacts with light at longer wavelengths, and these Zr-doped films had a lower energy gap (2.88 eV) than usual, which
could be beneficial for certain applications.