Determination of S, Ni, Cu in copper-nickel sulfide ores by total reflection X-ray fluorescence analysis: experience of participation in the interlaboratory comparisons

Abstract

The quality of the determination of S, Ni, Cu in copper-nickel sulfide ores was assessed in the framework of the program for interlaboratory comparative tests (ICT) using total reflection X-ray fluorescence analysis (TXRF) taking into account the criteria for methods for determining the chemical composition of mineral raw materials. Certified TXRF techniques for the analysis of mineral materials are absent, so the interlaboratory comparison test was used to control and improve the accuracy of measurements by TXRF. Powdered ore samples were prepared as suspensions by wet grinding: 100 mg of the powder, 4 ml of ultra-pure water and 250 μl of the Ga standard solution were milled using 20 g of ZrO2 balls 1 mm in diameter in the mixing mill for 10 minutes at a frequency of 20 Hz. The ratio of the intensities of the characteristic lines of the analyzed elements and the Ga internal standard was chosen as an analytical signal. To plot calibration curves, a set of ore reference samples was analyzed using certified procedures (atomic absorption spectrometry for Cu, Ni, gravimetry for S). The quality of the TXRF analysis was assessed by the value of Z-criterion. The measurement error did not exceed 5 rel. %. The relative percentage differences between the TXRF results and the results obtained in the interlaboratory study was less than 10%. The described method can be used for rapid analysis of copper-nickel sulfide ores.