Focal plane imaging system based on CMOS terahertz detector

Abstract

Terahertz technology has shown remarkable potential for application in the field of imaging since it offers several particular advantages such as great penetration capabilities, non-ionization and high instantaneous bandwidth. This paper presents a focal plane imging system based on CMOS terathertz detector for forward-looking detection. The focal plane imaging system has several advantages, including fast scanning, simple composition, low cost, and easy integration of a CMOS detector. It is composed of a terahertz radiation source, a Polytetrafluoroethylene (PTFE) lens and a broadband CMOS detector. The detector was fabricated in a 65 nm CMOS process. The operating frequency range of the detector covers 75 GHz to 1000 GHz. Measurement results have shown that the focal plane imaging system is capable of stably imaging at frequencies of 100 GHz and 220 GHz. To address the issue of missing information in measurement images, the morphological closing algorithm is employed to process the original image, successfully filling in the missing information and improving image quality.