A Deep Deterministic Policy Gradient-Based Method for Enforcing Service Fault-Tolerance in MEC

IF 1.6 4区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Chinese Journal of Electronics Pub Date : 2024-07-22 DOI:10.23919/cje.2023.00.105
Tingyan Long;Peng Chen;Yunni Xia;Yong Ma;Xiaoning Sun;Jiale Zhao;Yifei Lyu
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Abstract

Mobile edge computing (MEC) provides edge services to users in a distributed and on-demand way. Due to the heterogeneity of edge applications, deploying latency and resource-intensive applications on resource-constrained devices is a key challenge for service providers. This is especially true when underlying edge infrastructures are fault and error-prone. In this paper, we propose a fault tolerance approach named DFGP, for enforcing mobile service fault-tolerance in MEC. It synthesizes a generative optimization network (GON) model for predicting resource failure and a deep deterministic policy gradient (DDPG) model for yielding preemptive migration decisions. We show through extensive simulation experiments that DFGP is more effective in fault detection and guaranteeing quality of service, in terms of fault detection accuracy, migration efficiency, task migration time, task scheduling time, and energy consumption than other existing methods.
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基于深度确定性策略梯度的方法,用于在 MEC 中执行服务容错
移动边缘计算(MEC)以分布式和按需方式为用户提供边缘服务。由于边缘应用的异构性,在资源有限的设备上部署延迟和资源密集型应用是服务提供商面临的主要挑战。当底层边缘基础设施容易出现故障和错误时,情况更是如此。本文提出了一种名为 DFGP 的容错方法,用于在 MEC 中执行移动服务容错。它综合了用于预测资源故障的生成优化网络(GON)模型和用于做出抢占式迁移决策的深度确定性策略梯度(DDPG)模型。我们通过大量仿真实验表明,与其他现有方法相比,DFGP 在故障检测准确性、迁移效率、任务迁移时间、任务调度时间和能耗等方面都能更有效地检测故障并保证服务质量。
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来源期刊
Chinese Journal of Electronics
Chinese Journal of Electronics 工程技术-工程:电子与电气
CiteScore
3.70
自引率
16.70%
发文量
342
审稿时长
12.0 months
期刊介绍: CJE focuses on the emerging fields of electronics, publishing innovative and transformative research papers. Most of the papers published in CJE are from universities and research institutes, presenting their innovative research results. Both theoretical and practical contributions are encouraged, and original research papers reporting novel solutions to the hot topics in electronics are strongly recommended.
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