Bridging length scales in hard materials with ultra-small angle X-ray scattering – a critical review

IF 2.9 2区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY IUCrJ Pub Date : 2024-09-01 DOI:10.1107/S2052252524006298
Fan Zhang , Jan Ilavsky
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Abstract

This review examines the use of ultra-small angle X-ray scattering (USAXS), a nondestructive technique for analyzing the multi-scale microstructures of hard materials such as ceramics, metals and composites. It discusses the principles, benefits and challenges of USAXS, along with its potential to advance materials development and optimize manufacturing processes, while also considering future enhancements through multimodal characterization and machine learning.

Owing to their exceptional properties, hard materials such as advanced ceramics, metals and composites have enormous economic and societal value, with applications across numerous industries. Understanding their microstructural characteristics is crucial for enhancing their performance, materials development and unleashing their potential for future innovative applications. However, their microstructures are unambiguously hierarchical and typically span several length scales, from sub-ångstrom to micrometres, posing demanding challenges for their characterization, especially for in situ characterization which is critical to understanding the kinetic processes controlling microstructure formation. This review provides a comprehensive description of the rapidly developing technique of ultra-small angle X-ray scattering (USAXS), a nondestructive method for probing the nano-to-micrometre scale features of hard materials. USAXS and its complementary techniques, when developed for and applied to hard materials, offer valuable insights into their porosity, grain size, phase composition and inhomogeneities. We discuss the fundamental principles, instrumentation, advantages, challenges and global status of USAXS for hard materials. Using selected examples, we demonstrate the potential of this technique for unveiling the microstructural characteristics of hard materials and its relevance to advanced materials development and manufacturing process optimization. We also provide our perspective on the opportunities and challenges for the continued development of USAXS, including multimodal characterization, coherent scattering, time-resolved studies, machine learning and autonomous experiments. Our goal is to stimulate further implementation and exploration of USAXS techniques and inspire their broader adoption across various domains of hard materials science, thereby driving the field toward discoveries and further developments.

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用超小角 X 射线散射弥合硬质材料的长度尺度--重要综述。
先进陶瓷、金属和复合材料等硬质材料因其卓越的性能而具有巨大的经济和社会价值,可应用于众多行业。了解它们的微观结构特征对于提高性能、材料开发和释放未来创新应用的潜力至关重要。然而,它们的微观结构具有明确的层次性,通常跨越多个长度尺度,从亚恩斯特到微米不等,这给它们的表征带来了严峻的挑战,尤其是原位表征,这对于了解控制微观结构形成的动力学过程至关重要。本综述全面介绍了快速发展的超小角度 X 射线散射(USAXS)技术,这是一种探测硬质材料纳米到微米尺度特征的无损方法。USAXS 及其补充技术专为硬质材料开发并应用于硬质材料,为深入了解其孔隙率、晶粒尺寸、相组成和不均匀性提供了宝贵的资料。我们将讨论用于硬质材料的 USAXS 的基本原理、仪器、优势、挑战和全球现状。我们通过选定的示例,展示了该技术在揭示硬质材料微观结构特征方面的潜力及其与先进材料开发和制造工艺优化的相关性。我们还从多模态表征、相干散射、时间分辨研究、机器学习和自主实验等角度阐述了继续发展 USAXS 所面临的机遇和挑战。我们的目标是激励进一步实施和探索 USAXS 技术,并鼓励在硬材料科学的各个领域更广泛地采用这些技术,从而推动该领域的发现和进一步发展。
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来源期刊
IUCrJ
IUCrJ CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.50
自引率
5.10%
发文量
95
审稿时长
10 weeks
期刊介绍: IUCrJ is a new fully open-access peer-reviewed journal from the International Union of Crystallography (IUCr). The journal will publish high-profile articles on all aspects of the sciences and technologies supported by the IUCr via its commissions, including emerging fields where structural results underpin the science reported in the article. Our aim is to make IUCrJ the natural home for high-quality structural science results. Chemists, biologists, physicists and material scientists will be actively encouraged to report their structural studies in IUCrJ.
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