{"title":"A Simple and Effective Planar Near-Field Measurement Method With Sparse Nonuniform Sampling","authors":"Yinglong Chen;Xiaobo Liu;Junhao Zheng;Xiaoming Chen","doi":"10.1109/LAWP.2024.3437431","DOIUrl":null,"url":null,"abstract":"This letter presents a sparse nonuniform sampling method for a planar near-field measurement system. First, the Igloo spherical sampling points are mapped into the near-field planar sampling points, which determine the positions and quantity of nonuniform sampling points. Then, the sparse nonuniform sampling points can accurately recover the near-field distribution through linear interpolation. Finally, the fast Fourier transform-based near-to-far-field transformation is applied to derive the far-field radiation pattern of the antenna under the test. Simulations and measurements demonstrate that the near-field and far-field results agree well with those obtained through the existing half-wavelength uniform sampling method. Thus, the presented method can significantly reduce the sampling points without sacrificing the measurement accuracy.","PeriodicalId":51059,"journal":{"name":"IEEE Antennas and Wireless Propagation Letters","volume":"23 11","pages":"3947-3951"},"PeriodicalIF":4.8000,"publicationDate":"2024-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Antennas and Wireless Propagation Letters","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10621604/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This letter presents a sparse nonuniform sampling method for a planar near-field measurement system. First, the Igloo spherical sampling points are mapped into the near-field planar sampling points, which determine the positions and quantity of nonuniform sampling points. Then, the sparse nonuniform sampling points can accurately recover the near-field distribution through linear interpolation. Finally, the fast Fourier transform-based near-to-far-field transformation is applied to derive the far-field radiation pattern of the antenna under the test. Simulations and measurements demonstrate that the near-field and far-field results agree well with those obtained through the existing half-wavelength uniform sampling method. Thus, the presented method can significantly reduce the sampling points without sacrificing the measurement accuracy.
期刊介绍：
IEEE Antennas and Wireless Propagation Letters (AWP Letters) is devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation. These are areas of competence for the IEEE Antennas and Propagation Society (AP-S). AWPL aims to be one of the "fastest" journals among IEEE publications. This means that for papers that are eventually accepted, it is intended that an author may expect his or her paper to appear in IEEE Xplore, on average, around two months after submission.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
