Elucidation of discharge mechanisms in He- and Ar-flexible μ-tube plasmas by temporally and spatially resolved plasma optical emission phoresis spectroscopy

IF 3.2 2区化学 Q1 SPECTROSCOPY Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2024-08-05 DOI:10.1016/j.sab.2024.107014

Hao Song , Caiyan Tian , Luisa Speicher , Norman Ahlmann , Sebastian Brandt , Guanghui Niu , Joachim Franzke

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Abstract

A Helium- and Argon-flexible μ-tube plasma (FμTP) driven by a square wave high voltage were investigated by means of temporally and spatially resolved spectroscopy to characterize the discharge mechanisms. These two discharge gases show different discharge behavior in the same FμTP-configuration. The mixtures of different concentration of propane in Ar were used as discharge gases to confirm the role of Ar⁺ in an Ar-FμTP by tuning the discharge behavior. It was demonstrated that, N₂⁺ are mainly responsible for the excitation and ionization and only small amount of He⁺ are produced in a He-FμTP, whereas Ar-FμTP lives from Ar⁺. These ions as well as excited species do not propagate beyond the capillary during the negative half cycle, resulting in a negligible contribution for protonation in this half cycle. The present study proposes a new method to data analysis, Plasma Optical Emission Phoresis Spectroscopy, which allows to distinguish noble gas ions from excited noble gas species.

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通过时间和空间分辨等离子体光发射磷光光谱阐明氦和氩柔性μ管等离子体中的放电机制

我们通过时间和空间分辨光谱仪研究了由方波高压驱动的氦气和氩气柔性微管等离子体（FμTP），以确定放电机制的特征。在相同的 FμTP 配置下，这两种放电气体表现出不同的放电行为。氩气中不同浓度的丙烷混合物被用作放电气体，通过调整放电行为来证实 Ar+ 在氩气-FμTP 中的作用。结果表明，N2+ 主要负责激发和电离，He-FμTP 中只产生少量 He+，而 Ar-FμTP 则由 Ar+产生。在负半周期间，这些离子和激发物种不会传播到毛细管之外，因此在这个半周内对质子化的贡献可以忽略不计。本研究提出了一种新的数据分析方法--等离子体光学发射磷光光谱法，它可以区分惰性气体离子和激发的惰性气体物种。

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来源期刊

Spectrochimica Acta Part B: Atomic Spectroscopy 物理-光谱学

CiteScore

6.10

自引率

12.10%

发文量

173

审稿时长

81 days

期刊介绍： Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.