Bernard Dieny, Sanjeev Aggarwal, Vinayak Bharat Naik, Sebastien Couet, Thomas Coughlin, Shunsuke Fukami, Kevin Garello, Jack Guedj, Jean Anne C. Incorvia, Laurent Lebrun, Kyung-Jin Lee, Daniele Leonelli, Yonghwan Noh, Siamak Salimy, Steven Soss, Luc Thomas, Weigang Wang, Daniel Worledge
{"title":"Impact of external magnetic fields on STT-MRAM","authors":"Bernard Dieny, Sanjeev Aggarwal, Vinayak Bharat Naik, Sebastien Couet, Thomas Coughlin, Shunsuke Fukami, Kevin Garello, Jack Guedj, Jean Anne C. Incorvia, Laurent Lebrun, Kyung-Jin Lee, Daniele Leonelli, Yonghwan Noh, Siamak Salimy, Steven Soss, Luc Thomas, Weigang Wang, Daniel Worledge","doi":"arxiv-2409.05584","DOIUrl":null,"url":null,"abstract":"This application note discusses the working principle of spin-transfer torque\nmagnetoresistive random access memory (STT-MRAM) and the impact that magnetic\nfields can have on STT-MRAM operation. Sources of magnetic field and typical\nmagnitudes of magnetic fields are given. Based on the magnitude of commonly\nencountered external magnetic fields, we show below that magnetic immunity of\nSTT-MRAM is sufficient for most uses once the chip is mounted on a printed\ncircuit board (PCB) or inserted in its working environment. This statement is\nsupported by the experience acquired during 60 years of use of magnetic hard\ndisk drives (HDD) including 20 years of HDD with readers comprising magnetic\ntunnel junctions, 20+ years of use of magnetic field sensors as position\nencoders in automotive industry and 15+ years of use of MRAM. Mainly during\nchip handling does caution need to be exercised to avoid exposing the chip to\nexcessively high magnetic fields.","PeriodicalId":501083,"journal":{"name":"arXiv - PHYS - Applied Physics","volume":"12 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"arXiv - PHYS - Applied Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/arxiv-2409.05584","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This application note discusses the working principle of spin-transfer torque
magnetoresistive random access memory (STT-MRAM) and the impact that magnetic
fields can have on STT-MRAM operation. Sources of magnetic field and typical
magnitudes of magnetic fields are given. Based on the magnitude of commonly
encountered external magnetic fields, we show below that magnetic immunity of
STT-MRAM is sufficient for most uses once the chip is mounted on a printed
circuit board (PCB) or inserted in its working environment. This statement is
supported by the experience acquired during 60 years of use of magnetic hard
disk drives (HDD) including 20 years of HDD with readers comprising magnetic
tunnel junctions, 20+ years of use of magnetic field sensors as position
encoders in automotive industry and 15+ years of use of MRAM. Mainly during
chip handling does caution need to be exercised to avoid exposing the chip to
excessively high magnetic fields.