The bulk-edge correspondence for curved interfaces

Alexis Drouot, Xiaowen Zhu
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Abstract

The bulk-edge correspondence is a condensed matter theorem that relates the conductance of a Hall insulator in a half-plane to that of its (straight) boundary. In this work, we extend this result to domains with curved boundaries. Under mild geometric assumptions, we prove that the edge conductance of a topological insulator sample is an integer multiple of its Hall conductance. This integer counts the algebraic number of times that the interface (suitably oriented) enters the measurement set. This result provides a rigorous proof of a well-known experimental observation: arbitrarily truncated topological insulators support edge currents, regardless of the shape of their boundary.
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曲线界面的体边对应关系
体边对应是一个凝聚态定理,它将霍尔绝缘体在半平面上的电导与其(直线)边界的电导联系起来。在这项工作中,我们将这一结果扩展到具有弯曲边界的域。在温和的几何假设条件下,我们证明了拓扑绝缘体样本的边缘电导是其霍尔电导的整数倍。这个整数是指界面(适当定向)进入测量集的代数次数。这一结果严格证明了一个著名的实验观察结果:无论拓扑绝缘体的边界形状如何,任意截断的拓扑绝缘体都支持边缘电流。
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