Letian Huang;Tianjin Zhao;Ziren Wang;Junkai Zhan;Junshi Wang;Xiaohang Wang
{"title":"Component Dependencies Based Network-on-Chip Test","authors":"Letian Huang;Tianjin Zhao;Ziren Wang;Junkai Zhan;Junshi Wang;Xiaohang Wang","doi":"10.1109/TC.2024.3457732","DOIUrl":null,"url":null,"abstract":"On-line test of NoC is essential for its reliability. This paper proposed an integral test solution for on-line test of NoC to reduce the test cost and improve the reliability of NOC. The test solution includes a new partitioning method, as well as a test method and a test schedule which are based on the proposed partitioning method. The new partitioning method partitions the NoC into a new type of basis unit under test (UUT) named as interdependent components based unit under test (iDC-UUT), which applies component test methods. The iDC-UUT have very low level of functional interdependency and simple physical connection, which results in small test overhead and high test coverage. The proposed test method consists of DFT architecture, test wrapper and test vectors, which can speed-up the test procedure and further improve the test coverage. The proposed test schedule reduces the blockage probability of data packets during testing by increasing the degree of test disorder, so as to further reduce the test cost. Experimental results show that the proposed test solution reduces power and area by 12.7% and 22.7% over an existing test solution. The average latency is reduced by 22.6% to 38.4% over the existing test solution.","PeriodicalId":13087,"journal":{"name":"IEEE Transactions on Computers","volume":"73 12","pages":"2805-2816"},"PeriodicalIF":3.6000,"publicationDate":"2024-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Computers","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10677369/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
On-line test of NoC is essential for its reliability. This paper proposed an integral test solution for on-line test of NoC to reduce the test cost and improve the reliability of NOC. The test solution includes a new partitioning method, as well as a test method and a test schedule which are based on the proposed partitioning method. The new partitioning method partitions the NoC into a new type of basis unit under test (UUT) named as interdependent components based unit under test (iDC-UUT), which applies component test methods. The iDC-UUT have very low level of functional interdependency and simple physical connection, which results in small test overhead and high test coverage. The proposed test method consists of DFT architecture, test wrapper and test vectors, which can speed-up the test procedure and further improve the test coverage. The proposed test schedule reduces the blockage probability of data packets during testing by increasing the degree of test disorder, so as to further reduce the test cost. Experimental results show that the proposed test solution reduces power and area by 12.7% and 22.7% over an existing test solution. The average latency is reduced by 22.6% to 38.4% over the existing test solution.
期刊介绍:
The IEEE Transactions on Computers is a monthly publication with a wide distribution to researchers, developers, technical managers, and educators in the computer field. It publishes papers on research in areas of current interest to the readers. These areas include, but are not limited to, the following: a) computer organizations and architectures; b) operating systems, software systems, and communication protocols; c) real-time systems and embedded systems; d) digital devices, computer components, and interconnection networks; e) specification, design, prototyping, and testing methods and tools; f) performance, fault tolerance, reliability, security, and testability; g) case studies and experimental and theoretical evaluations; and h) new and important applications and trends.