A Voltage Monitoring Approach for Faster Reducing Flux Trapping in Josephson Junction Arrays

Abstract

Based on the characteristic change in the resistance of superconducting devices during the superconducting transition, a quantitative method to determine the temperature of superconducting devices has been proposed. This method can detect in real time whether the temperature of the superconducting device exceeds the superconducting transition temperature, thereby enabling quick reduction of the trapped magnetic flux in devices. We apply this method in our experiment, which uses a superconducting 22 subarrays programmable Josephson voltage standard device and obtains satisfactory results. We conclude that this method can efficiently reduce the trapped magnetic flux in superconducting devices and facilitate testing for measurement systems which do not possess thermometers.