M. F. Stupak, N. N. Mikhailov, S. A. Dvoretsky, S. N. Makarov, A. G. Yelesin, A. G. Verhoglyad
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引用次数: 0
Abstract
The characteristics of a highly sensitive express bench for nonlinear optical diagnosis of crystalline structures such as sphalerite by generation of the second harmonica are presented. The analysis of the possibilities of quantitative and qualitative characterization of the features of the crystalline parameters of the layers of heteroepitaxial structures CdxHg1 –xTe on substrates from GaAs with orientation (013) was carried out. The results were obtained by deviations of orientation in layers from the orientation of the substrate, which arose during the epitaxy, to determine the existence of stresses. The high sensitivity of the bench revealed the presence/absence of micro-particles with a disordered crystalline structure. Experimental results of reversible modification of the “in situ” crystalline state of CdxHg1 –xTe structures with short-term local radiation exposure of high power laser radiation are given. New experimental data have been presented showing that the components of the nonlineaic susceptibility tensor χxyz(ω) of the crystalline structure of CdxHg1 –xTe depend on composition and are an order of magnitude larger than similar components of tensor in CdTe and GaAs.
期刊介绍：
Technical Physics is a journal that contains practical information on all aspects of applied physics, especially instrumentation and measurement techniques. Particular emphasis is put on plasma physics and related fields such as studies of charged particles in electromagnetic fields, synchrotron radiation, electron and ion beams, gas lasers and discharges. Other journal topics are the properties of condensed matter, including semiconductors, superconductors, gases, liquids, and different materials.
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