{"title":"Application of the GIXRD Technique to Investigation of Damaged Layers in NaNd(WO4)2 and NaNd(MoO4)2 Ceramics Irradiated with High-Energy Ions","authors":"P. A. Yunin, A. A. Nazarov, E. A. Potanina","doi":"10.1134/S1063784224010432","DOIUrl":null,"url":null,"abstract":"<p>The technique of grazing incidence X-ray diffractometry (GIXRD) was used to study damaged layers in NaNd(WO<sub>4</sub>)<sub>2</sub> and NaNd(MoO<sub>4</sub>)<sub>2</sub> ceramics irradiated with high-energy ions. The possibilities and applicability limits of the technique for the analysis of such samples are shown. Estimates of the degree of amorphization in near-surface layers of ceramics are given depending on the irradiation dose. The higher resistance of NaNd(MoO<sub>4</sub>)<sub>2</sub> ceramics to external radiation exposure as compared to NaNd(WO<sub>4</sub>)<sub>2</sub> has been demonstrated.</p>","PeriodicalId":783,"journal":{"name":"Technical Physics","volume":"69 2","pages":"442 - 446"},"PeriodicalIF":0.7000,"publicationDate":"2024-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Physics","FirstCategoryId":"101","ListUrlMain":"https://link.springer.com/article/10.1134/S1063784224010432","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 0
Abstract
The technique of grazing incidence X-ray diffractometry (GIXRD) was used to study damaged layers in NaNd(WO4)2 and NaNd(MoO4)2 ceramics irradiated with high-energy ions. The possibilities and applicability limits of the technique for the analysis of such samples are shown. Estimates of the degree of amorphization in near-surface layers of ceramics are given depending on the irradiation dose. The higher resistance of NaNd(MoO4)2 ceramics to external radiation exposure as compared to NaNd(WO4)2 has been demonstrated.
期刊介绍：
Technical Physics is a journal that contains practical information on all aspects of applied physics, especially instrumentation and measurement techniques. Particular emphasis is put on plasma physics and related fields such as studies of charged particles in electromagnetic fields, synchrotron radiation, electron and ion beams, gas lasers and discharges. Other journal topics are the properties of condensed matter, including semiconductors, superconductors, gases, liquids, and different materials.
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