C60 Functionalized Single‐Walled Carbon Nanotube‐based Phototransistor for Efficient Detection of Visible Light Under Appropriate Gate Electrostatics

Divyanshu Rathore, Uttam Narendra Thakur, Arnab Hazra
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Abstract

The current study concerns highly reliable visible light sensing by C60 fullerene functionalized single‐walled carbon nanotube (SWCNT) based phototransistor. The absorbance of visible light (532 nm) increases significantly due to the formation of an interlink between the SWCNT network and C60 clusters. Photogenerated excess electrons in SWCNT are trapped by the C60 clusters and increase the effective hole concentrations in the SWCNT channel, which eventually improves the photoconductive gain. C60‐SWCNT channel is further integrated into the back gated field effect transistor (FET) structure in which 90 nm SiO2 dielectric thickness is used. The responsivity toward visible light is further enlarged with appropriate negative gate electrostatic. In order to ensure the morphological and structural behavior of C60‐SWCNT, various microscopic and spectroscopic characterizations are performed. The C60‐SWCNT phototransistor exhibits responsivity of 1.219 A W−1 at Vgs = – 21 V. The detectivity and rise/fall time of C60‐SWCNT came around to be 2.34 × 1010 Jones, 86.42 ms/3.35 ms at the same Vgs. The maximum external quantum efficiency (EQE) of the C60‐SWCNT phototransistor is very high, ≈274%. In the overall study, a comprehensive discussion is introduced on the effect of variable gate potential on the performance of the C60‐SWCNT phototransistor.

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基于 C60 功能化单壁碳纳米管的光电晶体管,可在适当的栅极静电条件下高效检测可见光
目前的研究涉及基于 C60 富勒烯功能化单壁碳纳米管(SWCNT)的光电晶体管的高可靠性可见光传感。由于 SWCNT 网络与 C60 簇之间形成了相互联系,可见光(532 纳米)的吸光度显著增加。SWCNT 中光生成的过剩电子被 C60 团簇捕获,增加了 SWCNT 通道中的有效空穴浓度,最终提高了光电导增益。C60-SWCNT 沟道被进一步集成到背栅场效应晶体管 (FET) 结构中,其中使用了厚度为 90 nm 的二氧化硅介质。适当的负栅极静电进一步提高了对可见光的响应率。为了确保 C60-SWCNT 的形态和结构行为,对其进行了各种显微和光谱表征。在 Vgs = - 21 V 时,C60-SWCNT 光电晶体管的响应率为 1.219 A W-1;在相同的 Vgs 下,C60-SWCNT 的检测率和上升/下降时间分别为 2.34 × 1010 Jones、86.42 ms/3.35 ms。C60-SWCNT 光电晶体管的最大外部量子效率(EQE)非常高,≈274%。在整个研究中,全面讨论了可变栅极电位对 C60-SWCNT 光晶体管性能的影响。
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