Masoud Pashaeifar;Anil Kumar Kumaran;Leo C. N. de Vreede;Morteza S. Alavi
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引用次数: 0
Abstract
This article introduces an N-way chain-weaver balanced power amplifier (PA) for millimeter-wave (mm-wave) phased-array transmitters (TXs). Taking advantage of the proposed combining network, an embedded impedance/power sensor is implemented, which can be utilized for output power regulation, built-in self-test, and load-based performance optimization. The proposed PA architecture offers linearity and gain robustness under the antenna’s frequency/time-dependent voltage standing wave ratio (VSWR). In the event of impedance mismatch, the proposed PA provides N different loads equally distributed on the VSWR circle. Consequently, the performance of the PAs is the average of N PAs with N different loads, which makes this structure VSWR resilient. As a proof of concept, an eight-way chain-weaver balanced PA (BPA) is realized in 40-nm bulk CMOS technology, and it delivers 25.19-dBm
${P} {_{\text {SAT}}}$
with 16.19% PAE. The proposed PA supports a 2-GHz 64-QAM OFDM signal with 16-dBm average power, achieving −25-dB error vector magnitude (EVM). The average EVM is better than −30.3 dB without digital pre-distortion (DPD) for an “800-MHz 256-QAM OFDM” signal while generating an average output power of 12.17 dBm. The performance of the PA is also evaluated under 1.5:1–3:1 VSWR conditions. The measured small-signal gain variation under VSWR 3:1 is ±0.7 dB. Moreover, assuming any frequency/time-dependent loading condition within the VSWR 3:1 circle, the proposed chain-weaver BPA achieves <2.8° amplitude-to-phase (AM-PM) over 3-GHz bandwidth. Besides, the embedded impedance/power sensor accuracy outperforms the state of the art. The proposed impedance sensor can measure VSWR 3:1 by the maximum angle and magnitude errors of 12.3° and 0.106, respectively.
期刊介绍:
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.