Til Hillebrecht;Morten Schierholz;Youcef Hassab;Johannes Alfert;Christian Schuster
{"title":"Generation and Application of a Very Large Dataset for Signal Integrity Via Array and Link Analysis","authors":"Til Hillebrecht;Morten Schierholz;Youcef Hassab;Johannes Alfert;Christian Schuster","doi":"10.1109/TEMC.2024.3450307","DOIUrl":null,"url":null,"abstract":"In this article, a physics inspired and data-driven analysis is performed using a very large dataset of printed circuit board (PCB) based high-speed interconnects. Three different subsets are defined having approximately 15000 PCB material and geometry variations. To the authors' knowledge, this dataset is the largest ever generated and applied dataset for signal integrity (SI) purposes. The dataset is generated using accurate physics based (PB) modeling up to \n<inline-formula><tex-math>$60 \\,\\mathrm{G}\\mathrm{Hz}$</tex-math></inline-formula>\n and provided for download in the SI/PI-Database. The first two subsets consist of a single-ended and a differential via array with up to 116 ports with arbitrary positions for signal, power, and ground vias. The third subset represents a link over differential transmission lines between two via arrays. A data and machine learning (ML) analysis is performed showing the dependencies between the PCB parameters and clock frequency of PCI Gen 6. The large and realistic defined design spaces reflect the high complexity and dimensionality of the SI design problems and allow multipurpose ML-based analysis.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 6","pages":"1967-1976"},"PeriodicalIF":2.5000,"publicationDate":"2024-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electromagnetic Compatibility","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10683805/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this article, a physics inspired and data-driven analysis is performed using a very large dataset of printed circuit board (PCB) based high-speed interconnects. Three different subsets are defined having approximately 15000 PCB material and geometry variations. To the authors' knowledge, this dataset is the largest ever generated and applied dataset for signal integrity (SI) purposes. The dataset is generated using accurate physics based (PB) modeling up to
$60 \,\mathrm{G}\mathrm{Hz}$
and provided for download in the SI/PI-Database. The first two subsets consist of a single-ended and a differential via array with up to 116 ports with arbitrary positions for signal, power, and ground vias. The third subset represents a link over differential transmission lines between two via arrays. A data and machine learning (ML) analysis is performed showing the dependencies between the PCB parameters and clock frequency of PCI Gen 6. The large and realistic defined design spaces reflect the high complexity and dimensionality of the SI design problems and allow multipurpose ML-based analysis.
期刊介绍:
IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.