{"title":"Cross-Attention Regression Flow for Defect Detection","authors":"Binhui Liu;Tianchu Guo;Bin Luo;Zhen Cui;Jian Yang","doi":"10.1109/TIP.2024.3457236","DOIUrl":null,"url":null,"abstract":"Defect detection from images is a crucial and challenging topic of industry scenarios due to the scarcity and unpredictability of anomalous samples. However, existing defect detection methods exhibit low detection performance when it comes to small-size defects. In this work, we propose a Cross-Attention Regression Flow (CARF) framework to model a compact distribution of normal visual patterns for separating outliers. To retain rich scale information of defects, we build an interactive cross-attention pattern flow module to jointly transform and align distributions of multi-layer features, which is beneficial for detecting small-size defects that may be annihilated in high-level features. To handle the complexity of multi-layer feature distributions, we introduce a layer-conditional autoregression module to improve the fitting capacity of data likelihoods on multi-layer features. By transforming the multi-layer feature distributions into a latent space, we can better characterize normal visual patterns. Extensive experiments on four public datasets and our collected industrial dataset demonstrate that the proposed CARF outperforms state-of-the-art methods, particularly in detecting small-size defects.","PeriodicalId":94032,"journal":{"name":"IEEE transactions on image processing : a publication of the IEEE Signal Processing Society","volume":"33 ","pages":"5183-5193"},"PeriodicalIF":0.0000,"publicationDate":"2024-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE transactions on image processing : a publication of the IEEE Signal Processing Society","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10681003/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Defect detection from images is a crucial and challenging topic of industry scenarios due to the scarcity and unpredictability of anomalous samples. However, existing defect detection methods exhibit low detection performance when it comes to small-size defects. In this work, we propose a Cross-Attention Regression Flow (CARF) framework to model a compact distribution of normal visual patterns for separating outliers. To retain rich scale information of defects, we build an interactive cross-attention pattern flow module to jointly transform and align distributions of multi-layer features, which is beneficial for detecting small-size defects that may be annihilated in high-level features. To handle the complexity of multi-layer feature distributions, we introduce a layer-conditional autoregression module to improve the fitting capacity of data likelihoods on multi-layer features. By transforming the multi-layer feature distributions into a latent space, we can better characterize normal visual patterns. Extensive experiments on four public datasets and our collected industrial dataset demonstrate that the proposed CARF outperforms state-of-the-art methods, particularly in detecting small-size defects.