O. B. Ball, R. J. Husband, J. D. McHardy, M. I. McMahon, C. Strohm, Z. Konôpková, K. Appel, V. Cerantola, A. L. Coleman, H. Cynn, A. Dwivedi, A. F. Goncharov, H. Graafsma, L. Q. Huston, H. Hwang, J. Kaa, J.-Y. Kim, E. Koemets, T. Laurus, X. Li, H. Marquardt, A. S. J. Méndez, S. Merkel, A. Mondal, G. Morard, V. B. Prakapenka, C. Prescher, T. R. Preston, S. Speziale, S. Stern, B. T. Sturtevant, J. Sztuk-Dambietz, N. Velisavljevic, C.-S. Yoo, U. Zastrau, Zs. Jenei, H. P. Liermann, R. S. McWilliams
{"title":"Measurement bias in self-heating x-ray free electron laser experiments from diffraction studies of phase transformation in titanium","authors":"O. B. Ball, R. J. Husband, J. D. McHardy, M. I. McMahon, C. Strohm, Z. Konôpková, K. Appel, V. Cerantola, A. L. Coleman, H. Cynn, A. Dwivedi, A. F. Goncharov, H. Graafsma, L. Q. Huston, H. Hwang, J. Kaa, J.-Y. Kim, E. Koemets, T. Laurus, X. Li, H. Marquardt, A. S. J. Méndez, S. Merkel, A. Mondal, G. Morard, V. B. Prakapenka, C. Prescher, T. R. Preston, S. Speziale, S. Stern, B. T. Sturtevant, J. Sztuk-Dambietz, N. Velisavljevic, C.-S. Yoo, U. Zastrau, Zs. Jenei, H. P. Liermann, R. S. McWilliams","doi":"10.1063/5.0215908","DOIUrl":null,"url":null,"abstract":"X-ray self-heating is a common by-product of X-ray Free Electron Laser (XFEL) techniques that can affect targets, optics, and other irradiated materials. Diagnosis of heating and induced changes in samples may be performed using the x-ray beam itself as a probe. However, the relationship between conditions created by and inferred from x-ray irradiation is unclear and may be highly dependent on the material system under consideration. Here, we report on a simple case study of a titanium foil irradiated, heated, and probed by a MHz XFEL pulse train at 18.1 keV delivered by the European XFEL using measured x-ray diffraction to determine temperature and finite element analysis to interpret the experimental data. We find a complex relationship between apparent temperatures and sample temperature distributions that must be accounted for to adequately interpret the data, including beam averaging effects, multivalued temperatures due to sample phase transitions, and jumps and gaps in the observable temperature near phase transformations. The results have implications for studies employing x-ray probing of systems with large temperature gradients, particularly where these gradients are produced by the beam itself. Finally, this study shows the potential complexity of studying nonlinear sample behavior, such as phase transformations, where biasing effects of temperature gradients can become paramount, precluding clear observation of true transformation conditions.","PeriodicalId":15088,"journal":{"name":"Journal of Applied Physics","volume":null,"pages":null},"PeriodicalIF":2.7000,"publicationDate":"2024-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Physics","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1063/5.0215908","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 0
Abstract
X-ray self-heating is a common by-product of X-ray Free Electron Laser (XFEL) techniques that can affect targets, optics, and other irradiated materials. Diagnosis of heating and induced changes in samples may be performed using the x-ray beam itself as a probe. However, the relationship between conditions created by and inferred from x-ray irradiation is unclear and may be highly dependent on the material system under consideration. Here, we report on a simple case study of a titanium foil irradiated, heated, and probed by a MHz XFEL pulse train at 18.1 keV delivered by the European XFEL using measured x-ray diffraction to determine temperature and finite element analysis to interpret the experimental data. We find a complex relationship between apparent temperatures and sample temperature distributions that must be accounted for to adequately interpret the data, including beam averaging effects, multivalued temperatures due to sample phase transitions, and jumps and gaps in the observable temperature near phase transformations. The results have implications for studies employing x-ray probing of systems with large temperature gradients, particularly where these gradients are produced by the beam itself. Finally, this study shows the potential complexity of studying nonlinear sample behavior, such as phase transformations, where biasing effects of temperature gradients can become paramount, precluding clear observation of true transformation conditions.
X 射线自热是 X 射线自由电子激光(XFEL)技术的常见副产品,会影响目标、光学器件和其他辐照材料。可以使用 X 射线束本身作为探针,对样品中的加热和诱导变化进行诊断。然而,X 射线辐照所产生的条件与推断出的条件之间的关系尚不明确,而且可能在很大程度上取决于所考虑的材料系统。在此,我们报告了一个简单的案例研究,即欧洲 XFEL 发射的 18.1 千伏的 MHz XFEL 脉冲串对钛箔进行辐照、加热和探测,利用测量的 X 射线衍射确定温度,并利用有限元分析解释实验数据。我们发现表观温度和样品温度分布之间存在复杂的关系,必须考虑到这些因素才能充分解释数据,包括光束平均效应、样品相变引起的多值温度以及相变附近可观测温度的跳跃和间隙。这些结果对采用 X 射线探测具有较大温度梯度的系统的研究具有重要意义,特别是当这些梯度是由光束本身产生的时候。最后,这项研究显示了研究非线性样品行为(如相变)的潜在复杂性,在这种情况下,温度梯度的偏差效应可能变得至关重要,从而阻碍了对真实转变条件的清晰观测。
期刊介绍:
The Journal of Applied Physics (JAP) is an influential international journal publishing significant new experimental and theoretical results of applied physics research.
Topics covered in JAP are diverse and reflect the most current applied physics research, including:
Dielectrics, ferroelectrics, and multiferroics-
Electrical discharges, plasmas, and plasma-surface interactions-
Emerging, interdisciplinary, and other fields of applied physics-
Magnetism, spintronics, and superconductivity-
Organic-Inorganic systems, including organic electronics-
Photonics, plasmonics, photovoltaics, lasers, optical materials, and phenomena-
Physics of devices and sensors-
Physics of materials, including electrical, thermal, mechanical and other properties-
Physics of matter under extreme conditions-
Physics of nanoscale and low-dimensional systems, including atomic and quantum phenomena-
Physics of semiconductors-
Soft matter, fluids, and biophysics-
Thin films, interfaces, and surfaces