{"title":"A Coupling-Adaptive Wireless Power Transfer System With Voltage-/Current-Mode Receiver and Global Digital-PWM Regulation","authors":"Tianqi Lu;Sijun Du","doi":"10.1109/JSSC.2024.3461857","DOIUrl":null,"url":null,"abstract":"This article presents a 13.56-MHz wireless power transfer (WPT) system with coupling variation robustness and high efficiency for powering biomedical implantable devices (IMDs). To sustain reliable power transfer against inductive-link fluctuation, a hybrid voltage-/current-mode (V/CM) receiver (RX) is proposed to provide CM recovery when the coupling becomes weak for VM operation. To optimize the end-to-end (E2E) efficiency, a digital pulsewidth modulation (PWM)-based global power regulation technique is proposed, which allows a fully on/off operation of the three-mode power amplifier (PA) at the transmitter (TX) side and fast load-transient responses. Moreover, the system adopts a fully integrated voltage-sensing load-shift-keying (LSK) demodulation technique, which replaces conventional current sensing methods with a streamlined implementation and reduced power consumption. Both prototype TX and RX chips were fabricated in a 180-nm CMOS process. The proposed system, powered by a 1.8-V supply at TX, realizes a regulated 1.8-V dc output at RX. With the help of the hybrid V/CM RX, the proposed system achieves an up-to-150% WPT range extension compared to VM-only operation and an up to 7.2-cm WPT range. Benefiting from the global digital-PWM regulation, it achieves up to 72.3% E2E efficiency over the loading range from 0.18 to 81 mW. A 10-\n<inline-formula> <tex-math>$\\mu $ </tex-math></inline-formula>\ns load-transient recovery is also attained at a \n<inline-formula> <tex-math>$164{\\times }$ </tex-math></inline-formula>\n load step with a 110-mV undershoot and unnoticeable overshoots.","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"59 12","pages":"4175-4187"},"PeriodicalIF":5.6000,"publicationDate":"2024-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Solid-state Circuits","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10693609/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This article presents a 13.56-MHz wireless power transfer (WPT) system with coupling variation robustness and high efficiency for powering biomedical implantable devices (IMDs). To sustain reliable power transfer against inductive-link fluctuation, a hybrid voltage-/current-mode (V/CM) receiver (RX) is proposed to provide CM recovery when the coupling becomes weak for VM operation. To optimize the end-to-end (E2E) efficiency, a digital pulsewidth modulation (PWM)-based global power regulation technique is proposed, which allows a fully on/off operation of the three-mode power amplifier (PA) at the transmitter (TX) side and fast load-transient responses. Moreover, the system adopts a fully integrated voltage-sensing load-shift-keying (LSK) demodulation technique, which replaces conventional current sensing methods with a streamlined implementation and reduced power consumption. Both prototype TX and RX chips were fabricated in a 180-nm CMOS process. The proposed system, powered by a 1.8-V supply at TX, realizes a regulated 1.8-V dc output at RX. With the help of the hybrid V/CM RX, the proposed system achieves an up-to-150% WPT range extension compared to VM-only operation and an up to 7.2-cm WPT range. Benefiting from the global digital-PWM regulation, it achieves up to 72.3% E2E efficiency over the loading range from 0.18 to 81 mW. A 10-
$\mu $
s load-transient recovery is also attained at a
$164{\times }$
load step with a 110-mV undershoot and unnoticeable overshoots.
期刊介绍:
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.