Dual Polarization Dynamic Alignment of Integrated Phased Arrays

IF 5.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2024-09-26 DOI:10.1109/JSSC.2024.3460188
Geonho Park;Chul Soon Park;Tae Hwan Jang
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Abstract

This study proposes the concept of dual polarization dynamic alignment (DPDA) technique for integrated phased arrays. The proposed technique enables the alignment of two polarization signals in the receive dual-polarized (DP) antenna, independent of the alignment conditions between the transmit and receive antennas, while effectively mitigating cross-polarization leakage (XPL). To verify the proposed technique, a receive phased array IC with 2V ${+} \,\, 2$ H configuration was fabricated using a 65-nm CMOS process, and a prototype antenna-in-package (AiP) was fabricated by integrating it with a 2-element dual-polarized antenna. The experimental results show that the prototype AiP achieves 20–32 dB cross-polarization isolation (XPI) within 2 GHz bandwidth at 58.2 GHz center frequency when the proposed technique is adopted, even if there is misalignment between the transmit and receive antennas up to 90°. To the best of the authors’ knowledge, this is the first study for DP signals to improve XPI even under conditions where the transmit and receive antennas are misaligned by up to 90° in a 60 GHz unlicensed band.
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集成相控阵的双偏振动态排列
提出了集成相控阵双偏振动态对准技术的概念。该技术能够在接收双极化(DP)天线中实现两个极化信号的对准,而不受发射和接收天线之间对准条件的影响,同时有效地减轻交叉极化泄漏(XPL)。为了验证所提出的技术,采用65纳米CMOS工艺制作了2V ${+} \,\, 2$ H结构的接收相控阵IC,并通过将其与2元双极化天线集成制成了封装天线(AiP)原型。实验结果表明,在58.2 GHz中心频率下,即使发射天线和接收天线之间存在90°的不对准,采用该技术的样机在2 GHz带宽内也能实现20-32 dB的交叉极化隔离(XPI)。据作者所知,这是第一次对DP信号进行研究,即使在发射和接收天线在60 GHz未经许可的频段中偏差高达90°的情况下,也能提高XPI。
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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