{"title":"25.2-Gb/s/pin NRZ/PAM-3 Dual-Mode Transmitter With Embedded Partial DBI: Improving I/O Bandwidth/pin and DBI Efficiencies","authors":"Chanheum Han;Ki-Soo Lee;Joo-Hyung Chae","doi":"10.1109/JSSC.2024.3459076","DOIUrl":null,"url":null,"abstract":"We present an NRZ/PAM-3 dual-mode transmitter featuring a 9-bit/6-UI-based embedded partial data bus inversion (pDBI). In this design, if the number of “1”s exceeds three in the initial 6-bit/4-UI segment of the 9-bit/6-UI PAM-3 data, the data are inverted to reduce the signaling current. A pDBI masking bit is inserted in the final 3-bit/2-UI segment to utilize a vacant 1-bit position left in every 8-bit sequence due to the memory’s burst length (BL) specification. This configuration eliminates the need for a DBI pin, thereby improving pin efficiency. Compared to previous data bus inversion (DBI) schemes used in NRZ and PAM-3 signaling, our proposed pDBI scheme significantly improves DBI, pin, and I/O bandwidth/pin efficiencies. Additionally, our design supports a single-loop ZQ calibration for both NRZ and PAM-3 modes, employing one-point calibration in NRZ and two-point calibration in PAM-3, ensuring optimal ratio of level mismatch (RLM) in PAM-3. A prototype chip, fabricated using a 65-nm CMOS process, achieved data rates of 14 Gb/s in NRZ mode and 25.2 Gb/s in PAM-3 mode under the -4.4-dB channel loss at 8.4 GHz. We also verified a peak DBI efficiency of 19.3% and measured an RLM of 98.5% in PAM-3 mode with the two-point ZQ calibration.","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 5","pages":"1782-1792"},"PeriodicalIF":5.6000,"publicationDate":"2024-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Solid-state Circuits","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10697134/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
We present an NRZ/PAM-3 dual-mode transmitter featuring a 9-bit/6-UI-based embedded partial data bus inversion (pDBI). In this design, if the number of “1”s exceeds three in the initial 6-bit/4-UI segment of the 9-bit/6-UI PAM-3 data, the data are inverted to reduce the signaling current. A pDBI masking bit is inserted in the final 3-bit/2-UI segment to utilize a vacant 1-bit position left in every 8-bit sequence due to the memory’s burst length (BL) specification. This configuration eliminates the need for a DBI pin, thereby improving pin efficiency. Compared to previous data bus inversion (DBI) schemes used in NRZ and PAM-3 signaling, our proposed pDBI scheme significantly improves DBI, pin, and I/O bandwidth/pin efficiencies. Additionally, our design supports a single-loop ZQ calibration for both NRZ and PAM-3 modes, employing one-point calibration in NRZ and two-point calibration in PAM-3, ensuring optimal ratio of level mismatch (RLM) in PAM-3. A prototype chip, fabricated using a 65-nm CMOS process, achieved data rates of 14 Gb/s in NRZ mode and 25.2 Gb/s in PAM-3 mode under the -4.4-dB channel loss at 8.4 GHz. We also verified a peak DBI efficiency of 19.3% and measured an RLM of 98.5% in PAM-3 mode with the two-point ZQ calibration.
期刊介绍:
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.