Uncertainty Analysis for EMC Simulation Based on Bayesian Optimization

IF 2.5 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-09-30 DOI:10.1109/TEMC.2024.3457787
Jinjun Bai;Bing Hu;Alistair Duffy
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Abstract

Nonintrusive uncertainty analysis methods are widely applied in the field of electromagnetic compatibility (EMC). When selecting deterministic EMC simulation sampling points as the training set, the existing methods are relatively mechanistic, which can seriously affect the computational efficiency of the uncertainty analysis process. In order to address this computational efficiency issue, this article proposes an EMC simulation uncertainty analysis method based on Bayesian optimization algorithm. This method constructs a Gaussian process surrogate model through a more adaptive training set filtering strategy so as to achieve the goal of giving consideration to both computational efficiency and accuracy. Crosstalk prediction of parallel cables, electromagnetic interference of lightning electromagnetic pulse, and strong nonlinear uncertainty analysis are used to quantitatively verify that the proposed uncertainty analysis method is more efficient and accurate than the traditional non-intrusive method, especially when dealing with complex EMC simulation problems with strong nonlinearity.
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基于贝叶斯优化的 EMC 仿真不确定性分析
非侵入式不确定性分析方法在电磁兼容领域得到了广泛的应用。在选择确定性电磁兼容仿真采样点作为训练集时,现有方法相对机械,严重影响不确定性分析过程的计算效率。为了解决这一计算效率问题,本文提出了一种基于贝叶斯优化算法的电磁兼容仿真不确定性分析方法。该方法通过适应性更强的训练集滤波策略构建高斯过程代理模型,从而达到兼顾计算效率和精度的目的。通过对并联电缆的串扰预测、雷电电磁脉冲的电磁干扰以及强非线性不确定性分析,定量验证了所提出的不确定性分析方法在处理强非线性复杂的电磁兼容仿真问题时,比传统的非侵入式方法具有更高的效率和准确性。
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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