{"title":"Uncertainty Analysis for EMC Simulation Based on Bayesian Optimization","authors":"Jinjun Bai;Bing Hu;Alistair Duffy","doi":"10.1109/TEMC.2024.3457787","DOIUrl":null,"url":null,"abstract":"Nonintrusive uncertainty analysis methods are widely applied in the field of electromagnetic compatibility (EMC). When selecting deterministic EMC simulation sampling points as the training set, the existing methods are relatively mechanistic, which can seriously affect the computational efficiency of the uncertainty analysis process. In order to address this computational efficiency issue, this article proposes an EMC simulation uncertainty analysis method based on Bayesian optimization algorithm. This method constructs a Gaussian process surrogate model through a more adaptive training set filtering strategy so as to achieve the goal of giving consideration to both computational efficiency and accuracy. Crosstalk prediction of parallel cables, electromagnetic interference of lightning electromagnetic pulse, and strong nonlinear uncertainty analysis are used to quantitatively verify that the proposed uncertainty analysis method is more efficient and accurate than the traditional non-intrusive method, especially when dealing with complex EMC simulation problems with strong nonlinearity.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"587-597"},"PeriodicalIF":2.5000,"publicationDate":"2024-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electromagnetic Compatibility","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10700051/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Nonintrusive uncertainty analysis methods are widely applied in the field of electromagnetic compatibility (EMC). When selecting deterministic EMC simulation sampling points as the training set, the existing methods are relatively mechanistic, which can seriously affect the computational efficiency of the uncertainty analysis process. In order to address this computational efficiency issue, this article proposes an EMC simulation uncertainty analysis method based on Bayesian optimization algorithm. This method constructs a Gaussian process surrogate model through a more adaptive training set filtering strategy so as to achieve the goal of giving consideration to both computational efficiency and accuracy. Crosstalk prediction of parallel cables, electromagnetic interference of lightning electromagnetic pulse, and strong nonlinear uncertainty analysis are used to quantitatively verify that the proposed uncertainty analysis method is more efficient and accurate than the traditional non-intrusive method, especially when dealing with complex EMC simulation problems with strong nonlinearity.
期刊介绍:
IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.