{"title":"Meta-Learning With Intraclass and Interclass Optimization for Few-Shot Fault Diagnosis","authors":"Kang Li;Hao Ye;Xiaoyong Gao;Laibin Zhang","doi":"10.1109/TII.2024.3458091","DOIUrl":null,"url":null,"abstract":"Recent years have witnessed a booming interest in the data-driven paradigm for fault diagnosis. However, it is usually difficult to collect sufficient faulty data for model training in practical applications, thus limiting the application of these intelligent diagnosis methods. In this article, we develop a novel method named meta-learning with intraclass and interclass optimization (MLIIO), which targets training an effective metric-based fault classifier using limited data. On the one hand, an intraclass aggregation loss function is proposed to enable sample features from the same class to gather together. This yields a compact representation manifesting the central tendency for the same categories. On the other hand, an interclass discriminative loss function is proposed to enforce sample features from the different classes to maintain a large margin, which further ensures that the metric space has a clearer discriminative boundary. By applying the episodic training mechanism to optimize the proposed losses, general, and discriminative feature representations can be learned to more efficiently identify new failure scenarios with scarce data. Experimental results on a public rolling bearing dataset and a real-world railway turnout dataset showcase that the proposed MLIIO approach outperforms several state-of-the-art methodologies.","PeriodicalId":13301,"journal":{"name":"IEEE Transactions on Industrial Informatics","volume":"21 1","pages":"713-722"},"PeriodicalIF":9.9000,"publicationDate":"2024-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Industrial Informatics","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10704056/","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
Recent years have witnessed a booming interest in the data-driven paradigm for fault diagnosis. However, it is usually difficult to collect sufficient faulty data for model training in practical applications, thus limiting the application of these intelligent diagnosis methods. In this article, we develop a novel method named meta-learning with intraclass and interclass optimization (MLIIO), which targets training an effective metric-based fault classifier using limited data. On the one hand, an intraclass aggregation loss function is proposed to enable sample features from the same class to gather together. This yields a compact representation manifesting the central tendency for the same categories. On the other hand, an interclass discriminative loss function is proposed to enforce sample features from the different classes to maintain a large margin, which further ensures that the metric space has a clearer discriminative boundary. By applying the episodic training mechanism to optimize the proposed losses, general, and discriminative feature representations can be learned to more efficiently identify new failure scenarios with scarce data. Experimental results on a public rolling bearing dataset and a real-world railway turnout dataset showcase that the proposed MLIIO approach outperforms several state-of-the-art methodologies.
期刊介绍:
The IEEE Transactions on Industrial Informatics is a multidisciplinary journal dedicated to publishing technical papers that connect theory with practical applications of informatics in industrial settings. It focuses on the utilization of information in intelligent, distributed, and agile industrial automation and control systems. The scope includes topics such as knowledge-based and AI-enhanced automation, intelligent computer control systems, flexible and collaborative manufacturing, industrial informatics in software-defined vehicles and robotics, computer vision, industrial cyber-physical and industrial IoT systems, real-time and networked embedded systems, security in industrial processes, industrial communications, systems interoperability, and human-machine interaction.