Yuyan Li , Tiantian Wang , Jingsong Xie , Jinsong Yang , Tongyang Pan , Buyao Yang
{"title":"A simulation data-driven semi-supervised framework based on MK-KNN graph and ESSGAT for bearing fault diagnosis","authors":"Yuyan Li , Tiantian Wang , Jingsong Xie , Jinsong Yang , Tongyang Pan , Buyao Yang","doi":"10.1016/j.isatra.2024.09.029","DOIUrl":null,"url":null,"abstract":"<div><div>Current supervised intelligent fault diagnosis relies on abundant labeled data. However, collecting and labeling data are typically both expensive and time-consuming. Fault diagnosis with unlabeled data remains a significant challenge. To address this issue, a simulation data-driven semi-supervised framework based on multi-kernel K-nearest neighbor (MK-KNN) and edge self-supervised graph attention network (ESSGAT) is proposed. The novel MK-KNN establishes the neighborhood relationships between simulation data and real data. The developed multi-kernel function mitigates the risks of overfitting and underfitting, thereby enhancing the robustness of the simulation-real graphs. The designed ESSGAT employs two forms of self-supervised attention to predict the presence of edges, increasing the weights of crucial neighboring nodes in the MK-KNN graph. The performance of the proposed method is evaluated using a public bearing dataset and a self-constructed dataset of high-speed train axle box bearings. The results show that the proposed method achieves better diagnostic performance compared with other state-of-the-art graph construction methods and graph convolutional networks.</div></div>","PeriodicalId":14660,"journal":{"name":"ISA transactions","volume":"155 ","pages":"Pages 261-273"},"PeriodicalIF":6.5000,"publicationDate":"2024-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISA transactions","FirstCategoryId":"94","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0019057824004580","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
Current supervised intelligent fault diagnosis relies on abundant labeled data. However, collecting and labeling data are typically both expensive and time-consuming. Fault diagnosis with unlabeled data remains a significant challenge. To address this issue, a simulation data-driven semi-supervised framework based on multi-kernel K-nearest neighbor (MK-KNN) and edge self-supervised graph attention network (ESSGAT) is proposed. The novel MK-KNN establishes the neighborhood relationships between simulation data and real data. The developed multi-kernel function mitigates the risks of overfitting and underfitting, thereby enhancing the robustness of the simulation-real graphs. The designed ESSGAT employs two forms of self-supervised attention to predict the presence of edges, increasing the weights of crucial neighboring nodes in the MK-KNN graph. The performance of the proposed method is evaluated using a public bearing dataset and a self-constructed dataset of high-speed train axle box bearings. The results show that the proposed method achieves better diagnostic performance compared with other state-of-the-art graph construction methods and graph convolutional networks.
期刊介绍:
ISA Transactions serves as a platform for showcasing advancements in measurement and automation, catering to both industrial practitioners and applied researchers. It covers a wide array of topics within measurement, including sensors, signal processing, data analysis, and fault detection, supported by techniques such as artificial intelligence and communication systems. Automation topics encompass control strategies, modelling, system reliability, and maintenance, alongside optimization and human-machine interaction. The journal targets research and development professionals in control systems, process instrumentation, and automation from academia and industry.